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Bridges A, Yacoot A, Kissinger T, et al. Polarization-sensitive transfer matrix modeling for displacement measuring interferometry. Appl Opt. 2020;59(25):7694-7704doi: 10.1364/AO.396922.
Bridges, A., Yacoot, A., Kissinger, T., & Tatam, R. P. (2020). Polarization-sensitive transfer matrix modeling for displacement measuring interferometry. Applied optics, 59(25), 7694-7704. https://doi.org/10.1364/AO.396922
Bridges, Angus, et al. "Polarization-sensitive transfer matrix modeling for displacement measuring interferometry." Applied optics vol. 59,25 (2020): 7694-7704. doi: https://doi.org/10.1364/AO.396922
Bridges A, Yacoot A, Kissinger T, Tatam RP. Polarization-sensitive transfer matrix modeling for displacement measuring interferometry. Appl Opt. 2020 Sep 01;59(25):7694-7704. doi: 10.1364/AO.396922. PMID: 32902471.
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