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Kim T, Mok J, Lee E. Detecting Facial Region and Landmarks at Once via Deep Network. Sensors (Basel). 2021;21(16)doi: 10.3390/s21165360.
Kim, T., Mok, J., & Lee, E. (2021). Detecting Facial Region and Landmarks at Once via Deep Network. Sensors (Basel, Switzerland), 21(16), . https://doi.org/10.3390/s21165360
Kim, Taehyung, et al. "Detecting Facial Region and Landmarks at Once via Deep Network." Sensors (Basel, Switzerland) vol. 21,16 (2021). doi: https://doi.org/10.3390/s21165360
Kim T, Mok J, Lee E. Detecting Facial Region and Landmarks at Once via Deep Network. Sensors (Basel). 2021 Aug 09;21(16). doi: 10.3390/s21165360. PMID: 34450804; PMCID: PMC8401714.
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