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Lévêque O, Duverger R, Sauer H, et al. Influence of high numerical aperture on depth-of-field enhancing phase mask optimization in localization microscopy. J Opt Soc Am A Opt Image Sci Vis. 2021;38(9):1380-1390doi: 10.1364/JOSAA.432696.
Lévêque, O., Duverger, R., Sauer, H., Kulcsár, C., & Goudail, F. (2021). Influence of high numerical aperture on depth-of-field enhancing phase mask optimization in localization microscopy. Journal of the Optical Society of America. A, Optics, image science, and vision, 38(9), 1380-1390. https://doi.org/10.1364/JOSAA.432696
Lévêque, Olivier, et al. "Influence of high numerical aperture on depth-of-field enhancing phase mask optimization in localization microscopy." Journal of the Optical Society of America. A, Optics, image science, and vision vol. 38,9 (2021): 1380-1390. doi: https://doi.org/10.1364/JOSAA.432696
Lévêque O, Duverger R, Sauer H, Kulcsár C, Goudail F. Influence of high numerical aperture on depth-of-field enhancing phase mask optimization in localization microscopy. J Opt Soc Am A Opt Image Sci Vis. 2021 Sep 01;38(9):1380-1390. doi: 10.1364/JOSAA.432696. PMID: 34613146.
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