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Lu Y, Jing Z, Yong H, et al. Flux avalanche in a superconducting film with non-uniform critical current density. Proc Math Phys Eng Sci. 2016;472(2194):20160469doi: 10.1098/rspa.2016.0469.
Lu, Y., Jing, Z., Yong, H., & Zhou, Y. (2016). Flux avalanche in a superconducting film with non-uniform critical current density. Proceedings. Mathematical, physical, and engineering sciences, 472(2194), 20160469. https://doi.org/10.1098/rspa.2016.0469
Lu, Yurong, et al. "Flux avalanche in a superconducting film with non-uniform critical current density." Proceedings. Mathematical, physical, and engineering sciences vol. 472,2194 (2016): 20160469. doi: https://doi.org/10.1098/rspa.2016.0469
Lu Y, Jing Z, Yong H, Zhou Y. Flux avalanche in a superconducting film with non-uniform critical current density. Proc Math Phys Eng Sci. 2016 Oct;472(2194):20160469. doi: 10.1098/rspa.2016.0469. PMID: 27843407; PMCID: PMC5095448.
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Proc Math Phys Eng Sci. 2016 Oct;472(2194):20160469. doi: 10.1098/rspa.2016.0469.

Flux avalanche in a superconducting film with non-uniform critical current density.

Proceedings. Mathematical, physical, and engineering sciences

Yurong Lu, Ze Jing, Huadong Yong, Youhe Zhou

Affiliations

  1. Key Laboratory of Mechanics on Disaster and Environment in Western China, Ministry of Education of China, Lanzhou, Gansu 730000, People's Republic of China; Department of Mechanics and Engineering Sciences, College of Civil Engineering and Mechanics, Lanzhou University, Lanzhou, Gansu 730000, People's Republic of China.
  2. School of Mechano-Electronic Engineering , Xidian University , Xi'an, Shaanxi 710071 , People's Republic of China.

PMID: 27843407 PMCID: PMC5095448 DOI: 10.1098/rspa.2016.0469

Abstract

The flux avalanche in type-II superconducting thin film is numerically simulated in this paper. We mainly consider the effect of non-uniform critical current density on the thermomagnetic stability. The nonlinear electromagnetic constitutive relation of the superconductor is adopted. Then, Maxwell's equations and heat diffusion equation are numerically solved by the fast Fourier transform technique. We find that the non-uniform critical current density can remarkably affect the behaviour of the flux avalanche. The external magnetic field ramp rate and the environmental temperature have been taken into account. The results are compared with a film with uniform critical current density. The flux avalanche first appears at the interface where the critical current density is discontinuous. Under the same environmental temperature or magnetic field, the flux avalanche occurs more easily for the film with the non-uniform critical current density. The avalanche structure is a finger-like pattern rather than a dendritic structure at low environmental temperatures.

Keywords: critical current density; flux avalanche; magnetic field ramp rate; superconducting film

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