Cite
Chen H, Palmer N, Dayton M, et al. A high-speed two-frame, 1-2 ns gated X-ray CMOS imager used as a hohlraum diagnostic on the National Ignition Facility (invited). Rev Sci Instrum. 2016;87(11):11E203doi: 10.1063/1.4962252.
Chen, H., Palmer, N., Dayton, M., Carpenter, A., Schneider, M. B., Bell, P. M., Bradley, D. K., Claus, L. D., Fang, L., Hilsabeck, T., Hohenberger, M., Jones, O. S., Kilkenny, J. D., Kimmel, M. W., Robertson, G., Rochau, G., Sanchez, M. O., Stahoviak, J. W., Trotter, D. C., & Porter, J. L. (2016). A high-speed two-frame, 1-2 ns gated X-ray CMOS imager used as a hohlraum diagnostic on the National Ignition Facility (invited). The Review of scientific instruments, 87(11), 11E203. https://doi.org/10.1063/1.4962252
Chen, Hui, et al. "A high-speed two-frame, 1-2 ns gated X-ray CMOS imager used as a hohlraum diagnostic on the National Ignition Facility (invited)." The Review of scientific instruments vol. 87,11 (2016): 11E203. doi: https://doi.org/10.1063/1.4962252
Chen H, Palmer N, Dayton M, Carpenter A, Schneider MB, Bell PM, Bradley DK, Claus LD, Fang L, Hilsabeck T, Hohenberger M, Jones OS, Kilkenny JD, Kimmel MW, Robertson G, Rochau G, Sanchez MO, Stahoviak JW, Trotter DC, Porter JL. A high-speed two-frame, 1-2 ns gated X-ray CMOS imager used as a hohlraum diagnostic on the National Ignition Facility (invited). Rev Sci Instrum. 2016 Nov;87(11):11E203. doi: 10.1063/1.4962252. PMID: 27910306.
Copy
Download .nbib