L Duschek, A Beyer, JO Oelerich, K Volz - archiv.ub.uni-marburg.de

Composition determination for quaternary III-V semiconductors by aberration-corrected STEM.

Research training stem

Beyer, Duschek, Oelerich, Volz

GSID: mHkwZrSoso8J

Excerpt

Quantitative scanning transmission electron microscopy (STEM) is a powerful tool for the characterization of nano-materials. Absolute composition determination for ternary III–V …