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Gonzalez-Hernandez J, Morrison TI, Paesler MA, et al. Electronic characterization of the ordering of a-Ge with the use of x-ray-absorption near-edge structure. Phys Rev B Condens Matter. 1985;31(8):5474-5476doi: 10.1103/physrevb.31.5474.
Gonzalez-Hernandez, J., Morrison, T. I., Paesler, M. A., Sayers, D. E., & Tsu, R. (1985). Electronic characterization of the ordering of a-Ge with the use of x-ray-absorption near-edge structure. Physical review. B, Condensed matter, 31(8), 5474-5476. https://doi.org/10.1103/physrevb.31.5474
Gonzalez-Hernandez, et al. "Electronic characterization of the ordering of a-Ge with the use of x-ray-absorption near-edge structure." Physical review. B, Condensed matter vol. 31,8 (1985): 5474-5476. doi: https://doi.org/10.1103/physrevb.31.5474
Gonzalez-Hernandez J, Morrison TI, Paesler MA, Sayers DE, Tsu R. Electronic characterization of the ordering of a-Ge with the use of x-ray-absorption near-edge structure. Phys Rev B Condens Matter. 1985 Apr 15;31(8):5474-5476. doi: 10.1103/physrevb.31.5474. PMID: 9936519.
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