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Enhanced Self-Assembled Monolayer Surface Coverage by ALD NiO in p-i-n Perovskite Solar Cells.

ACS applied materials & interfaces

Phung N, Verheijen M, Todinova A, Datta K, Verhage M, Al-Ashouri A, Köbler H, Li X, Abate A, Albrecht S, Creatore M.
PMID: 34936322
ACS Appl Mater Interfaces. 2022 Jan 12;14(1):2166-2176. doi: 10.1021/acsami.1c15860. Epub 2021 Dec 22.

Metal halide perovskites have attracted tremendous attention due to their excellent electronic properties. Recent advancements in device performance and stability of perovskite solar cells (PSCs) have been achieved with the application of self-assembled monolayers (SAMs), serving as stand-alone hole...

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Phung N, Verheijen M, Todinova A, et al. Enhanced Self-Assembled Monolayer Surface Coverage by ALD NiO in p-i-n Perovskite Solar Cells. ACS Appl Mater Interfaces. 2021;14(1):2166-2176doi: 10.1021/acsami.1c15860.
Phung, N., Verheijen, M., Todinova, A., Datta, K., Verhage, M., Al-Ashouri, A., Köbler, H., Li, X., Abate, A., Albrecht, S., & Creatore, M. (2022). Enhanced Self-Assembled Monolayer Surface Coverage by ALD NiO in p-i-n Perovskite Solar Cells. ACS applied materials & interfaces, 14(1), 2166-2176. https://doi.org/10.1021/acsami.1c15860
Phung, Nga, et al. "Enhanced Self-Assembled Monolayer Surface Coverage by ALD NiO in p-i-n Perovskite Solar Cells." ACS applied materials & interfaces vol. 14,1 (2022): 2166-2176. doi: https://doi.org/10.1021/acsami.1c15860
Phung N, Verheijen M, Todinova A, Datta K, Verhage M, Al-Ashouri A, Köbler H, Li X, Abate A, Albrecht S, Creatore M. Enhanced Self-Assembled Monolayer Surface Coverage by ALD NiO in p-i-n Perovskite Solar Cells. ACS Appl Mater Interfaces. 2022 Jan 12;14(1):2166-2176. doi: 10.1021/acsami.1c15860. Epub 2021 Dec 22. PMID: 34936322.
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Atomic layer deposition of LiF using LiN(SiMe.

Physical chemistry chemical physics : PCCP

Hornsveld N, Kessels WMM, Synowicki RA, Creatore M.
PMID: 33885050
Phys Chem Chem Phys. 2021 Apr 21;23(15):9304-9314. doi: 10.1039/d0cp05428c. Epub 2021 Apr 07.

Lithium fluoride films were prepared by atomic layer deposition (ALD) using a new route in which LiN(SiMe

Cite
Hornsveld N, Kessels WMM, Synowicki RA, et al. Atomic layer deposition of LiF using LiN(SiMe. Phys Chem Chem Phys. 2021;23(15):9304-9314doi: 10.1039/d0cp05428c.
Hornsveld, N., Kessels, W. M. M., Synowicki, R. A., & Creatore, M. (2021). Atomic layer deposition of LiF using LiN(SiMe. Physical chemistry chemical physics : PCCP, 23(15), 9304-9314. https://doi.org/10.1039/d0cp05428c
Hornsveld, N, et al. "Atomic layer deposition of LiF using LiN(SiMe." Physical chemistry chemical physics : PCCP vol. 23,15 (2021): 9304-9314. doi: https://doi.org/10.1039/d0cp05428c
Hornsveld N, Kessels WMM, Synowicki RA, Creatore M. Atomic layer deposition of LiF using LiN(SiMe. Phys Chem Chem Phys. 2021 Apr 21;23(15):9304-9314. doi: 10.1039/d0cp05428c. Epub 2021 Apr 07. PMID: 33885050.
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An ultrahigh-resolution soft x-ray microscope for quantitative analysis of chemically heterogeneous nanomaterials.

Science advances

Shapiro DA, Babin S, Celestre RS, Chao W, Conley RP, Denes P, Enders B, Enfedaque P, James S, Joseph JM, Krishnan H, Marchesini S, Muriki K, Nowrouzi K, Oh SR, Padmore H, Warwick T, Yang L, Yashchuk VV, Yu YS, Zhao J.
PMID: 33328228
Sci Adv. 2020 Dec 16;6(51). doi: 10.1126/sciadv.abc4904. Print 2020 Dec.

The analysis of chemical states and morphology in nanomaterials is central to many areas of science. We address this need with an ultrahigh-resolution scanning transmission soft x-ray microscope. Our instrument provides multiple analysis tools in a compact assembly and...

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Shapiro DA, Babin S, Celestre RS, et al. An ultrahigh-resolution soft x-ray microscope for quantitative analysis of chemically heterogeneous nanomaterials. Sci Adv. 2020;6(51)doi: 10.1126/sciadv.abc4904.
Shapiro, D. A., Babin, S., Celestre, R. S., Chao, W., Conley, R. P., Denes, P., Enders, B., Enfedaque, P., James, S., Joseph, J. M., Krishnan, H., Marchesini, S., Muriki, K., Nowrouzi, K., Oh, S. R., Padmore, H., Warwick, T., Yang, L., Yashchuk, V. V., Yu, Y. S., & Zhao, J. (2020). An ultrahigh-resolution soft x-ray microscope for quantitative analysis of chemically heterogeneous nanomaterials. Science advances, 6(51), . https://doi.org/10.1126/sciadv.abc4904
Shapiro, David A, et al. "An ultrahigh-resolution soft x-ray microscope for quantitative analysis of chemically heterogeneous nanomaterials." Science advances vol. 6,51 (2020). doi: https://doi.org/10.1126/sciadv.abc4904
Shapiro DA, Babin S, Celestre RS, Chao W, Conley RP, Denes P, Enders B, Enfedaque P, James S, Joseph JM, Krishnan H, Marchesini S, Muriki K, Nowrouzi K, Oh SR, Padmore H, Warwick T, Yang L, Yashchuk VV, Yu YS, Zhao J. An ultrahigh-resolution soft x-ray microscope for quantitative analysis of chemically heterogeneous nanomaterials. Sci Adv. 2020 Dec 16;6(51). doi: 10.1126/sciadv.abc4904. Print 2020 Dec. PMID: 33328228; PMCID: PMC7744074.
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Showing 49 to 51 of 51 entries