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Tressel J, Abdelaziz M, Fried D. High contrast reflectance imaging at 1950 nm for the assessment of lesion activity on extracted teeth. Proc SPIE Int Soc Opt Eng. 2021;11627doi: 10.1117/12.2584909.
Tressel, J., Abdelaziz, M., & Fried, D. (2021). High contrast reflectance imaging at 1950 nm for the assessment of lesion activity on extracted teeth. Proceedings of SPIE--the International Society for Optical Engineering, 11627. https://doi.org/10.1117/12.2584909
Tressel, John, et al. "High contrast reflectance imaging at 1950 nm for the assessment of lesion activity on extracted teeth." Proceedings of SPIE--the International Society for Optical Engineering vol. 11627 (2021). doi: https://doi.org/10.1117/12.2584909
Tressel J, Abdelaziz M, Fried D. High contrast reflectance imaging at 1950 nm for the assessment of lesion activity on extracted teeth. Proc SPIE Int Soc Opt Eng. 2021 Mar;11627. doi: 10.1117/12.2584909. Epub 2021 Mar 05. PMID: 33762796; PMCID: PMC7986894.
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