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Lutz C, Hampel S, Beuermann S, et al. Determination of the through-plane profile of vanadium species in hydrated Nafion studied with micro X-ray absorption near-edge structure spectroscopy - proof of concept. J Synchrotron Radiat. 2021;28:1865-1873doi: 10.1107/S160057752100905X.
Lutz, C., Hampel, S., Beuermann, S., Turek, T., Kunz, U., Garrevoet, J., Falkenberg, G., & Fittschen, U. (2021). Determination of the through-plane profile of vanadium species in hydrated Nafion studied with micro X-ray absorption near-edge structure spectroscopy - proof of concept. Journal of synchrotron radiation, 281865-1873. https://doi.org/10.1107/S160057752100905X
Lutz, Christian, et al. "Determination of the through-plane profile of vanadium species in hydrated Nafion studied with micro X-ray absorption near-edge structure spectroscopy - proof of concept." Journal of synchrotron radiation vol. 28 (2021): 1865-1873. doi: https://doi.org/10.1107/S160057752100905X
Lutz C, Hampel S, Beuermann S, Turek T, Kunz U, Garrevoet J, Falkenberg G, Fittschen U. Determination of the through-plane profile of vanadium species in hydrated Nafion studied with micro X-ray absorption near-edge structure spectroscopy - proof of concept. J Synchrotron Radiat. 2021 Nov 01;28:1865-1873. doi: 10.1107/S160057752100905X. Epub 2021 Nov 03. PMID: 34738941; PMCID: PMC8570217.
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