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Rigosi AF, Glavin NR, Liu CI, et al. Preservation of Surface Conductivity and Dielectric Loss Tangent in Large-Scale, Encapsulated Epitaxial Graphene Measured by Noncontact Microwave Cavity Perturbations. Small. 2017;13(26)doi: 10.1002/smll.201700452.
Rigosi, A. F., Glavin, N. R., Liu, C. I., Yang, Y., Obrzut, J., Hill, H. M., Hu, J., Lee, H. Y., Hight Walker, A. R., Richter, C. A., Elmquist, R. E., & Newell, D. B. (2017). Preservation of Surface Conductivity and Dielectric Loss Tangent in Large-Scale, Encapsulated Epitaxial Graphene Measured by Noncontact Microwave Cavity Perturbations. Small (Weinheim an der Bergstrasse, Germany), 13(26), . https://doi.org/10.1002/smll.201700452
Rigosi, Albert F, et al. "Preservation of Surface Conductivity and Dielectric Loss Tangent in Large-Scale, Encapsulated Epitaxial Graphene Measured by Noncontact Microwave Cavity Perturbations." Small (Weinheim an der Bergstrasse, Germany) vol. 13,26 (2017). doi: https://doi.org/10.1002/smll.201700452
Rigosi AF, Glavin NR, Liu CI, Yang Y, Obrzut J, Hill HM, Hu J, Lee HY, Hight Walker AR, Richter CA, Elmquist RE, Newell DB. Preservation of Surface Conductivity and Dielectric Loss Tangent in Large-Scale, Encapsulated Epitaxial Graphene Measured by Noncontact Microwave Cavity Perturbations. Small. 2017 Jul;13(26). doi: 10.1002/smll.201700452. Epub 2017 May 19. PMID: 28544485; PMCID: PMC5512105.
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