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Schamm S, Bonafos C, Coffin H, et al. Imaging Si nanoparticles embedded in SiO(2) layers by (S)TEM-EELS. Ultramicroscopy. 2007;108(4):346-57doi: 10.1016/j.ultramic.2007.05.008.
Schamm, S., Bonafos, C., Coffin, H., Cherkashin, N., Carrada, M., Ben Assayag, G., Claverie, A., Tencé, M., & Colliex, C. (2008). Imaging Si nanoparticles embedded in SiO(2) layers by (S)TEM-EELS. Ultramicroscopy, 108(4), 346-57. https://doi.org/10.1016/j.ultramic.2007.05.008
Schamm, S, et al. "Imaging Si nanoparticles embedded in SiO(2) layers by (S)TEM-EELS." Ultramicroscopy vol. 108,4 (2008): 346-57. doi: https://doi.org/10.1016/j.ultramic.2007.05.008
Schamm S, Bonafos C, Coffin H, Cherkashin N, Carrada M, Ben Assayag G, Claverie A, Tencé M, Colliex C. Imaging Si nanoparticles embedded in SiO(2) layers by (S)TEM-EELS. Ultramicroscopy. 2008 Mar;108(4):346-57. doi: 10.1016/j.ultramic.2007.05.008. Epub 2007 May 29. PMID: 17616256.
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