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Johnson SL, Heimann PA, Lindenberg AM, et al. Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy. Phys Rev Lett. 2003;91(15):157403doi: 10.1103/PhysRevLett.91.157403.
Johnson, S. L., Heimann, P. A., Lindenberg, A. M., Jeschke, H. O., Garcia, M. E., Chang, Z., Lee, R. W., Rehr, J. J., & Falcone, R. W. (2003). Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy. Physical review letters, 91(15), 157403. https://doi.org/10.1103/PhysRevLett.91.157403
Johnson, S L, et al. "Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy." Physical review letters vol. 91,15 (2003): 157403. doi: https://doi.org/10.1103/PhysRevLett.91.157403
Johnson SL, Heimann PA, Lindenberg AM, Jeschke HO, Garcia ME, Chang Z, Lee RW, Rehr JJ, Falcone RW. Properties of liquid silicon observed by time-resolved x-ray absorption spectroscopy. Phys Rev Lett. 2003 Oct 10;91(15):157403. doi: 10.1103/PhysRevLett.91.157403. Epub 2003 Oct 09. PMID: 14611494.
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