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Meyer TR, Ziegler D, Brune C, et al. Height drift correction in non-raster atomic force microscopy. Ultramicroscopy. 2013;137:48-54doi: 10.1016/j.ultramic.2013.10.014.
Meyer, T. R., Ziegler, D., Brune, C., Chen, A., Farnham, R., Huynh, N., Chang, J. M., Bertozzi, A. L., & Ashby, P. D. (2014). Height drift correction in non-raster atomic force microscopy. Ultramicroscopy, 13748-54. https://doi.org/10.1016/j.ultramic.2013.10.014
Meyer, Travis R, et al. "Height drift correction in non-raster atomic force microscopy." Ultramicroscopy vol. 137 (2014): 48-54. doi: https://doi.org/10.1016/j.ultramic.2013.10.014
Meyer TR, Ziegler D, Brune C, Chen A, Farnham R, Huynh N, Chang JM, Bertozzi AL, Ashby PD. Height drift correction in non-raster atomic force microscopy. Ultramicroscopy. 2014 Feb;137:48-54. doi: 10.1016/j.ultramic.2013.10.014. Epub 2013 Nov 04. PMID: 24295799.
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