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Průša S, Procházka P, Bábor P, et al. Highly Sensitive Detection of Surface and Intercalated Impurities in Graphene by LEIS. Langmuir. 2015;31(35):9628-35doi: 10.1021/acs.langmuir.5b01935.
Průša, S., Procházka, P., Bábor, P., Šikola, T., ter Veen, R., Fartmann, M., Grehl, T., Brüner, P., Roth, D., Bauer, P., & Brongersma, H. H. (2015). Highly Sensitive Detection of Surface and Intercalated Impurities in Graphene by LEIS. Langmuir : the ACS journal of surfaces and colloids, 31(35), 9628-35. https://doi.org/10.1021/acs.langmuir.5b01935
Průša, Stanislav, et al. "Highly Sensitive Detection of Surface and Intercalated Impurities in Graphene by LEIS." Langmuir : the ACS journal of surfaces and colloids vol. 31,35 (2015): 9628-35. doi: https://doi.org/10.1021/acs.langmuir.5b01935
Průša S, Procházka P, Bábor P, Šikola T, ter Veen R, Fartmann M, Grehl T, Brüner P, Roth D, Bauer P, Brongersma HH. Highly Sensitive Detection of Surface and Intercalated Impurities in Graphene by LEIS. Langmuir. 2015 Sep 08;31(35):9628-35. doi: 10.1021/acs.langmuir.5b01935. Epub 2015 Aug 09. PMID: 26200443.
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