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Gregory AP, Blackburn JF, Lees K, et al. Measurement of the permittivity and loss of high-loss materials using a Near-Field Scanning Microwave Microscope. Ultramicroscopy. 2015;161:137-145doi: 10.1016/j.ultramic.2015.11.015.
Gregory, A. P., Blackburn, J. F., Lees, K., Clarke, R. N., Hodgetts, T. E., Hanham, S. M., & Klein, N. (2016). Measurement of the permittivity and loss of high-loss materials using a Near-Field Scanning Microwave Microscope. Ultramicroscopy, 161137-145. https://doi.org/10.1016/j.ultramic.2015.11.015
Gregory, A P, et al. "Measurement of the permittivity and loss of high-loss materials using a Near-Field Scanning Microwave Microscope." Ultramicroscopy vol. 161 (2016): 137-145. doi: https://doi.org/10.1016/j.ultramic.2015.11.015
Gregory AP, Blackburn JF, Lees K, Clarke RN, Hodgetts TE, Hanham SM, Klein N. Measurement of the permittivity and loss of high-loss materials using a Near-Field Scanning Microwave Microscope. Ultramicroscopy. 2016 Feb;161:137-145. doi: 10.1016/j.ultramic.2015.11.015. Epub 2015 Nov 30. PMID: 26686660.
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