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Rigutti L, Venturi L, Houard J, et al. Optical Contactless Measurement of Electric Field-Induced Tensile Stress in Diamond Nanoscale Needles. Nano Lett. 2017;17(12):7401-7409doi: 10.1021/acs.nanolett.7b03222.
Rigutti, L., Venturi, L., Houard, J., Normand, A., Silaeva, E. P., Borz, M., Malykhin, S. A., Obraztsov, A. N., & Vella, A. (2017). Optical Contactless Measurement of Electric Field-Induced Tensile Stress in Diamond Nanoscale Needles. Nano letters, 17(12), 7401-7409. https://doi.org/10.1021/acs.nanolett.7b03222
Rigutti, L, et al. "Optical Contactless Measurement of Electric Field-Induced Tensile Stress in Diamond Nanoscale Needles." Nano letters vol. 17,12 (2017): 7401-7409. doi: https://doi.org/10.1021/acs.nanolett.7b03222
Rigutti L, Venturi L, Houard J, Normand A, Silaeva EP, Borz M, Malykhin SA, Obraztsov AN, Vella A. Optical Contactless Measurement of Electric Field-Induced Tensile Stress in Diamond Nanoscale Needles. Nano Lett. 2017 Dec 13;17(12):7401-7409. doi: 10.1021/acs.nanolett.7b03222. Epub 2017 Nov 08. PMID: 29095635.
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