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Meyer JC, Eder F, Kurasch S, et al. Accurate measurement of electron beam induced displacement cross sections for single-layer graphene. Phys Rev Lett. 2012;108(19):196102doi: 10.1103/PhysRevLett.108.196102.
Meyer, J. C., Eder, F., Kurasch, S., Skakalova, V., Kotakoski, J., Park, H. J., Roth, S., Chuvilin, A., Eyhusen, S., Benner, G., Krasheninnikov, A. V., & Kaiser, U. (2012). Accurate measurement of electron beam induced displacement cross sections for single-layer graphene. Physical review letters, 108(19), 196102. https://doi.org/10.1103/PhysRevLett.108.196102
Meyer, Jannik C, et al. "Accurate measurement of electron beam induced displacement cross sections for single-layer graphene." Physical review letters vol. 108,19 (2012): 196102. doi: https://doi.org/10.1103/PhysRevLett.108.196102
Meyer JC, Eder F, Kurasch S, Skakalova V, Kotakoski J, Park HJ, Roth S, Chuvilin A, Eyhusen S, Benner G, Krasheninnikov AV, Kaiser U. Accurate measurement of electron beam induced displacement cross sections for single-layer graphene. Phys Rev Lett. 2012 May 11;108(19):196102. doi: 10.1103/PhysRevLett.108.196102. Epub 2012 May 07. PMID: 23003063.
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