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Dorgham A, Neville A, Ignatyev K, et al. An in situ synchrotron XAS methodology for surface analysis under high temperature, pressure, and shear. Rev Sci Instrum. 2017;88(1):015101doi: 10.1063/1.4973354.
Dorgham, A., Neville, A., Ignatyev, K., Mosselmans, F., & Morina, A. (2017). An in situ synchrotron XAS methodology for surface analysis under high temperature, pressure, and shear. The Review of scientific instruments, 88(1), 015101. https://doi.org/10.1063/1.4973354
Dorgham, A, et al. "An in situ synchrotron XAS methodology for surface analysis under high temperature, pressure, and shear." The Review of scientific instruments vol. 88,1 (2017): 015101. doi: https://doi.org/10.1063/1.4973354
Dorgham A, Neville A, Ignatyev K, Mosselmans F, Morina A. An in situ synchrotron XAS methodology for surface analysis under high temperature, pressure, and shear. Rev Sci Instrum. 2017 Jan;88(1):015101. doi: 10.1063/1.4973354. PMID: 28147643.
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