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Vine DJ, Williams GJ, Clark JN, et al. An in-vacuum x-ray diffraction microscope for use in the 0.7-2.9 keV range. Rev Sci Instrum. 2012;83(3):033703doi: 10.1063/1.3688655.
Vine, D. J., Williams, G. J., Clark, J. N., Putkunz, C. T., Pfeifer, M. A., Legnini, D., Roehrig, C., Wrobel, E., Huwald, E., van Riessen, G., Abbey, B., Beetz, T., Irwin, J., Feser, M., Hornberger, B., McNulty, I., Nugent, K. A., & Peele, A. G. (2012). An in-vacuum x-ray diffraction microscope for use in the 0.7-2.9 keV range. The Review of scientific instruments, 83(3), 033703. https://doi.org/10.1063/1.3688655
Vine, D J, et al. "An in-vacuum x-ray diffraction microscope for use in the 0.7-2.9 keV range." The Review of scientific instruments vol. 83,3 (2012): 033703. doi: https://doi.org/10.1063/1.3688655
Vine DJ, Williams GJ, Clark JN, Putkunz CT, Pfeifer MA, Legnini D, Roehrig C, Wrobel E, Huwald E, van Riessen G, Abbey B, Beetz T, Irwin J, Feser M, Hornberger B, McNulty I, Nugent KA, Peele AG. An in-vacuum x-ray diffraction microscope for use in the 0.7-2.9 keV range. Rev Sci Instrum. 2012 Mar;83(3):033703. doi: 10.1063/1.3688655. PMID: 22462925.
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