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Cui XD, Zarate X, Tomfohr J, et al. Bias-induced forces in conducting atomic force microscopy and contact charging of organic monolayers. Ultramicroscopy. 2002;92(2):67-76doi: 10.1016/s0304-3991(02)00069-4.
Cui, X. D., Zarate, X., Tomfohr, J., Primak, A., Moore, A. L., Moore, T. A., Gust, D., Harris, G., Sankey, O. F., & Lindsay, S. M. (2002). Bias-induced forces in conducting atomic force microscopy and contact charging of organic monolayers. Ultramicroscopy, 92(2), 67-76. https://doi.org/10.1016/s0304-3991(02)00069-4
Cui, X D, et al. "Bias-induced forces in conducting atomic force microscopy and contact charging of organic monolayers." Ultramicroscopy vol. 92,2 (2002): 67-76. doi: https://doi.org/10.1016/s0304-3991(02)00069-4
Cui XD, Zarate X, Tomfohr J, Primak A, Moore AL, Moore TA, Gust D, Harris G, Sankey OF, Lindsay SM. Bias-induced forces in conducting atomic force microscopy and contact charging of organic monolayers. Ultramicroscopy. 2002 Jul;92(2):67-76. doi: 10.1016/s0304-3991(02)00069-4. PMID: 12138944.
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