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Kelly DP, Ward JE, Hennelly BM, et al. Paraxial speckle-based metrology systems with an aperture. J Opt Soc Am A Opt Image Sci Vis. 2006;23(11):2861-70doi: 10.1364/josaa.23.002861.
Kelly, D. P., Ward, J. E., Hennelly, B. M., Gopinathan, U., O'Neill, F. T., & Sheridan, J. T. (2006). Paraxial speckle-based metrology systems with an aperture. Journal of the Optical Society of America. A, Optics, image science, and vision, 23(11), 2861-70. https://doi.org/10.1364/josaa.23.002861
Kelly, Damien P, et al. "Paraxial speckle-based metrology systems with an aperture." Journal of the Optical Society of America. A, Optics, image science, and vision vol. 23,11 (2006): 2861-70. doi: https://doi.org/10.1364/josaa.23.002861
Kelly DP, Ward JE, Hennelly BM, Gopinathan U, O'Neill FT, Sheridan JT. Paraxial speckle-based metrology systems with an aperture. J Opt Soc Am A Opt Image Sci Vis. 2006 Nov;23(11):2861-70. doi: 10.1364/josaa.23.002861. PMID: 17047714.
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