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Kozhevnikov IV, Filatova EO, Sokolov AA, et al. Comparative study of the X-ray reflectivity and in-depth profile of a-C, B₄C and Ni coatings at 0.1-2 keV. J Synchrotron Radiat. 2015;22(2):348-53doi: 10.1107/S1600577515000430.
Kozhevnikov, I. V., Filatova, E. O., Sokolov, A. A., Konashuk, A. S., Siewert, F., Störmer, M., Gaudin, J., Keitel, B., Samoylova, L., & Sinn, H. (2015). Comparative study of the X-ray reflectivity and in-depth profile of a-C, B₄C and Ni coatings at 0.1-2 keV. Journal of synchrotron radiation, 22(2), 348-53. https://doi.org/10.1107/S1600577515000430
Kozhevnikov, I V, et al. "Comparative study of the X-ray reflectivity and in-depth profile of a-C, B₄C and Ni coatings at 0.1-2 keV." Journal of synchrotron radiation vol. 22,2 (2015): 348-53. doi: https://doi.org/10.1107/S1600577515000430
Kozhevnikov IV, Filatova EO, Sokolov AA, Konashuk AS, Siewert F, Störmer M, Gaudin J, Keitel B, Samoylova L, Sinn H. Comparative study of the X-ray reflectivity and in-depth profile of a-C, B₄C and Ni coatings at 0.1-2 keV. J Synchrotron Radiat. 2015 Mar;22(2):348-53. doi: 10.1107/S1600577515000430. Epub 2015 Feb 11. PMID: 25723936.
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