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Vakulenko A, Kiriushechkina S, Wang M, et al. Near-Field Characterization of Higher-Order Topological Photonic States at Optical Frequencies. Adv Mater. 2021;33(18):e2004376doi: 10.1002/adma.202004376.
Vakulenko, A., Kiriushechkina, S., Wang, M., Li, M., Zhirihin, D., Ni, X., Guddala, S., Korobkin, D., Alù, A., & Khanikaev, A. B. (2021). Near-Field Characterization of Higher-Order Topological Photonic States at Optical Frequencies. Advanced materials (Deerfield Beach, Fla.), 33(18), e2004376. https://doi.org/10.1002/adma.202004376
Vakulenko, Anton, et al. "Near-Field Characterization of Higher-Order Topological Photonic States at Optical Frequencies." Advanced materials (Deerfield Beach, Fla.) vol. 33,18 (2021): e2004376. doi: https://doi.org/10.1002/adma.202004376
Vakulenko A, Kiriushechkina S, Wang M, Li M, Zhirihin D, Ni X, Guddala S, Korobkin D, Alù A, Khanikaev AB. Near-Field Characterization of Higher-Order Topological Photonic States at Optical Frequencies. Adv Mater. 2021 May;33(18):e2004376. doi: 10.1002/adma.202004376. Epub 2021 Mar 18. PMID: 33734495.
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