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Kim TY, Song Y, Cho K, et al. Analysis of the interface characteristics of CVD-grown monolayer MoS. Nanotechnology. 2017;28(14):145702doi: 10.1088/1361-6528/aa60f9.
Kim, T. Y., Song, Y., Cho, K., Amani, M., Ho Ahn, G., Kim, J. K., Pak, J., Chung, S., Javey, A., & Lee, T. (2017). Analysis of the interface characteristics of CVD-grown monolayer MoS. Nanotechnology, 28(14), 145702. https://doi.org/10.1088/1361-6528/aa60f9
Kim, Tae-Young, et al. "Analysis of the interface characteristics of CVD-grown monolayer MoS." Nanotechnology vol. 28,14 (2017): 145702. doi: https://doi.org/10.1088/1361-6528/aa60f9
Kim TY, Song Y, Cho K, Amani M, Ho Ahn G, Kim JK, Pak J, Chung S, Javey A, Lee T. Analysis of the interface characteristics of CVD-grown monolayer MoS. Nanotechnology. 2017 Apr 07;28(14):145702. doi: 10.1088/1361-6528/aa60f9. Epub 2017 Mar 09. PMID: 28276342.
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