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Koch P, Cole GD, Deutsch C, et al. Thickness uniformity measurements and damage threshold tests of large-area GaAs/AlGaAs crystalline coatings for precision interferometry. Opt Express. 2019;27(25):36731-36740doi: 10.1364/OE.27.036731.
Koch, P., Cole, G. D., Deutsch, C., Follman, D., Heu, P., Kinley-Hanlon, M., Kirchhoff, R., Leavey, S., Lehmann, J., Oppermann, P., Rai, A. K., Tornasi, Z., Wöhler, J., Wu, D. S., Zederbauer, T., & Lück, H. (2019). Thickness uniformity measurements and damage threshold tests of large-area GaAs/AlGaAs crystalline coatings for precision interferometry. Optics express, 27(25), 36731-36740. https://doi.org/10.1364/OE.27.036731
Koch, P, et al. "Thickness uniformity measurements and damage threshold tests of large-area GaAs/AlGaAs crystalline coatings for precision interferometry." Optics express vol. 27,25 (2019): 36731-36740. doi: https://doi.org/10.1364/OE.27.036731
Koch P, Cole GD, Deutsch C, Follman D, Heu P, Kinley-Hanlon M, Kirchhoff R, Leavey S, Lehmann J, Oppermann P, Rai AK, Tornasi Z, Wöhler J, Wu DS, Zederbauer T, Lück H. Thickness uniformity measurements and damage threshold tests of large-area GaAs/AlGaAs crystalline coatings for precision interferometry. Opt Express. 2019 Dec 09;27(25):36731-36740. doi: 10.1364/OE.27.036731. PMID: 31873446.
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