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Zeng SW, Yin XM, Herng TS, et al. Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces. Phys Rev Lett. 2018;121(14):146802doi: 10.1103/PhysRevLett.121.146802.
Zeng, S. W., Yin, X. M., Herng, T. S., Han, K., Huang, Z., Zhang, L. C., Li, C. J., Zhou, W. X., Wan, D. Y., Yang, P., Ding, J., Wee, A. T. S., Coey, J. M. D., Venkatesan, T., Rusydi, A., & Ariando, A. (2018). Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces. Physical review letters, 121(14), 146802. https://doi.org/10.1103/PhysRevLett.121.146802
Zeng, S W, et al. "Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces." Physical review letters vol. 121,14 (2018): 146802. doi: https://doi.org/10.1103/PhysRevLett.121.146802
Zeng SW, Yin XM, Herng TS, Han K, Huang Z, Zhang LC, Li CJ, Zhou WX, Wan DY, Yang P, Ding J, Wee ATS, Coey JMD, Venkatesan T, Rusydi A, Ariando A. Oxygen Electromigration and Energy Band Reconstruction Induced by Electrolyte Field Effect at Oxide Interfaces. Phys Rev Lett. 2018 Oct 05;121(14):146802. doi: 10.1103/PhysRevLett.121.146802. PMID: 30339445.
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