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Similar articles for PMID: 369302

Showing 1 to 7 of 7 entries
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Refractive indices of powdered materials and materials with nonspecularly reflecting surfaces: a simple method of determination.

Applied optics

Spitzer D.
PMID: 20154858
Appl Opt. 1975 Jul 01;14(7):1489-91. doi: 10.1364/AO.14.001489.

No abstract available.

Cite
Spitzer D. Refractive indices of powdered materials and materials with nonspecularly reflecting surfaces: a simple method of determination. Appl Opt. 1975;14(7):1489-91doi: 10.1364/AO.14.001489.
Spitzer, D. (1975). Refractive indices of powdered materials and materials with nonspecularly reflecting surfaces: a simple method of determination. Applied optics, 14(7), 1489-91. https://doi.org/10.1364/AO.14.001489
Spitzer, D. "Refractive indices of powdered materials and materials with nonspecularly reflecting surfaces: a simple method of determination." Applied optics vol. 14,7 (1975): 1489-91. doi: https://doi.org/10.1364/AO.14.001489
Spitzer D. Refractive indices of powdered materials and materials with nonspecularly reflecting surfaces: a simple method of determination. Appl Opt. 1975 Jul 01;14(7):1489-91. doi: 10.1364/AO.14.001489. PMID: 20154858.
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A note on Aherne's method of counting tissue components in relatively thick sections.

Journal of microscopy

Freedman LS.
PMID: 4597873
J Microsc. 1974 Mar;100(2):219-25. doi: 10.1111/j.1365-2818.1974.tb03931.x.

No abstract available.

Cite
Freedman LS. A note on Aherne's method of counting tissue components in relatively thick sections. J Microsc. 1974;100(2):219-25doi: 10.1111/j.1365-2818.1974.tb03931.x.
Freedman, L. S. (1974). A note on Aherne's method of counting tissue components in relatively thick sections. Journal of microscopy, 100(2), 219-25. https://doi.org/10.1111/j.1365-2818.1974.tb03931.x
Freedman, L S. "A note on Aherne's method of counting tissue components in relatively thick sections." Journal of microscopy vol. 100,2 (1974): 219-25. doi: https://doi.org/10.1111/j.1365-2818.1974.tb03931.x
Freedman LS. A note on Aherne's method of counting tissue components in relatively thick sections. J Microsc. 1974 Mar;100(2):219-25. doi: 10.1111/j.1365-2818.1974.tb03931.x. PMID: 4597873.
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SnapShot: Tissue Clearing.

Cell

Richardson DS, Lichtman JW.
PMID: 28985569
Cell. 2017 Oct 05;171(2):496-496.e1. doi: 10.1016/j.cell.2017.09.025.

Tissue clearing has become an important tool for the investigation of biological systems in three dimensions. However, many pioneering techniques were based on serendipitous discoveries. Next-generation clearing methods have been (re)designed with a better understanding of the chemistry and...

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Richardson DS, Lichtman JW. SnapShot: Tissue Clearing. Cell. 2017;171(2):496-496.e1doi: 10.1016/j.cell.2017.09.025.
Richardson, D. S., & Lichtman, J. W. (2017). SnapShot: Tissue Clearing. Cell, 171(2), 496-496.e1. https://doi.org/10.1016/j.cell.2017.09.025
Richardson, Douglas S, and Lichtman, Jeff W. "SnapShot: Tissue Clearing." Cell vol. 171,2 (2017): 496-496.e1. doi: https://doi.org/10.1016/j.cell.2017.09.025
Richardson DS, Lichtman JW. SnapShot: Tissue Clearing. Cell. 2017 Oct 05;171(2):496-496.e1. doi: 10.1016/j.cell.2017.09.025. PMID: 28985569.
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Estimation of section thickness unbiased by cutting-deformation.

Journal of microscopy

Gundersen HJ, Andersen BS, Fløe H.
PMID: 6350597
J Microsc. 1983 Jul;131:RP3-4. doi: 10.1111/j.1365-2818.1983.tb04224.x.

No abstract available.

Cite
Gundersen HJ, Andersen BS, Fløe H. Estimation of section thickness unbiased by cutting-deformation. J Microsc. 1983;131:RP3-4doi: 10.1111/j.1365-2818.1983.tb04224.x.
Gundersen, H. J., Andersen, B. S., & Fløe, H. (1983). Estimation of section thickness unbiased by cutting-deformation. Journal of microscopy, 131RP3-4. https://doi.org/10.1111/j.1365-2818.1983.tb04224.x
Gundersen, H J, et al. "Estimation of section thickness unbiased by cutting-deformation." Journal of microscopy vol. 131 (1983): RP3-4. doi: https://doi.org/10.1111/j.1365-2818.1983.tb04224.x
Gundersen HJ, Andersen BS, Fløe H. Estimation of section thickness unbiased by cutting-deformation. J Microsc. 1983 Jul;131:RP3-4. doi: 10.1111/j.1365-2818.1983.tb04224.x. PMID: 6350597.
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In situ investigation of drug diffusion in hydrogels by the refractive index method.

Analytical chemistry

Weng L, Lu Y, Shi L, Zhang X, Zhang L, Guo X, Xu J.
PMID: 15144191
Anal Chem. 2004 May 15;76(10):2807-12. doi: 10.1021/ac049975i.

This work describes a simple but novel analytical method for in situ monitoring of the diffusion process of drugs in hydrogels based on refractive index measurements. The diffusion process was monitored by recording the refraction of a laser beam...

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Weng L, Lu Y, Shi L, et al. In situ investigation of drug diffusion in hydrogels by the refractive index method. Anal Chem. 2004;76(10):2807-12doi: 10.1021/ac049975i.
Weng, L., Lu, Y., Shi, L., Zhang, X., Zhang, L., Guo, X., & Xu, J. (2004). In situ investigation of drug diffusion in hydrogels by the refractive index method. Analytical chemistry, 76(10), 2807-12. https://doi.org/10.1021/ac049975i
Weng, Lihui, et al. "In situ investigation of drug diffusion in hydrogels by the refractive index method." Analytical chemistry vol. 76,10 (2004): 2807-12. doi: https://doi.org/10.1021/ac049975i
Weng L, Lu Y, Shi L, Zhang X, Zhang L, Guo X, Xu J. In situ investigation of drug diffusion in hydrogels by the refractive index method. Anal Chem. 2004 May 15;76(10):2807-12. doi: 10.1021/ac049975i. PMID: 15144191.
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Comparing electron tomography and HRTEM slicing methods as tools to measure the thickness of nanoparticles.

Ultramicroscopy

Alloyeau D, Ricolleau C, Oikawa T, Langlois C, Le Bouar Y, Loiseau A.
PMID: 19327891
Ultramicroscopy. 2009 Jun;109(7):788-96. doi: 10.1016/j.ultramic.2009.02.002. Epub 2009 Feb 28.

Nanoparticles' morphology is a key parameter in the understanding of their thermodynamical, optical, magnetic and catalytic properties. In general, nanoparticles, observed in transmission electron microscopy (TEM), are viewed in projection so that the determination of their thickness (along the...

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Alloyeau D, Ricolleau C, Oikawa T, et al. Comparing electron tomography and HRTEM slicing methods as tools to measure the thickness of nanoparticles. Ultramicroscopy. 2009;109(7):788-96doi: 10.1016/j.ultramic.2009.02.002.
Alloyeau, D., Ricolleau, C., Oikawa, T., Langlois, C., Le Bouar, Y., & Loiseau, A. (2009). Comparing electron tomography and HRTEM slicing methods as tools to measure the thickness of nanoparticles. Ultramicroscopy, 109(7), 788-96. https://doi.org/10.1016/j.ultramic.2009.02.002
Alloyeau, D, et al. "Comparing electron tomography and HRTEM slicing methods as tools to measure the thickness of nanoparticles." Ultramicroscopy vol. 109,7 (2009): 788-96. doi: https://doi.org/10.1016/j.ultramic.2009.02.002
Alloyeau D, Ricolleau C, Oikawa T, Langlois C, Le Bouar Y, Loiseau A. Comparing electron tomography and HRTEM slicing methods as tools to measure the thickness of nanoparticles. Ultramicroscopy. 2009 Jun;109(7):788-96. doi: 10.1016/j.ultramic.2009.02.002. Epub 2009 Feb 28. PMID: 19327891.
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A procedure to determine the correct thickness of an object with confocal microscopy in case of refractive index mismatch.

Journal of microscopy

Kuypers LC, Decraemer WF, Dirckx JJ, Timmermans JP.
PMID: 15817065
J Microsc. 2005 Apr;218:68-78. doi: 10.1111/j.1365-2818.2005.01457.x.

A difference in refractive index (n) between immersion medium and specimen results in increasing loss of intensity and resolution with increasing focal depth and in an incorrect axial scaling in images of a confocal microscope. Axial thickness measurements of...

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Kuypers LC, Decraemer WF, Dirckx JJ, et al. A procedure to determine the correct thickness of an object with confocal microscopy in case of refractive index mismatch. J Microsc. 2005;218:68-78doi: 10.1111/j.1365-2818.2005.01457.x.
Kuypers, L. C., Decraemer, W. F., Dirckx, J. J., & Timmermans, J. P. (2005). A procedure to determine the correct thickness of an object with confocal microscopy in case of refractive index mismatch. Journal of microscopy, 21868-78. https://doi.org/10.1111/j.1365-2818.2005.01457.x
Kuypers, L C, et al. "A procedure to determine the correct thickness of an object with confocal microscopy in case of refractive index mismatch." Journal of microscopy vol. 218 (2005): 68-78. doi: https://doi.org/10.1111/j.1365-2818.2005.01457.x
Kuypers LC, Decraemer WF, Dirckx JJ, Timmermans JP. A procedure to determine the correct thickness of an object with confocal microscopy in case of refractive index mismatch. J Microsc. 2005 Apr;218:68-78. doi: 10.1111/j.1365-2818.2005.01457.x. PMID: 15817065.
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Showing 1 to 7 of 7 entries