Display options
Share it on

J Synchrotron Radiat. 1998 May 01;5:877-9. doi: 10.1107/S0909049598000016. Epub 1998 May 01.

Characterization and interpretation of the quantum efficiencies of multilayer semiconductor detectors using a new theory.

Journal of synchrotron radiation

T Cho, M Hirata, J Kohagura, Y Sakamoto, T Okamura, T Numakura, R Minami, Y Nishizawa, T Sasuga, T Tamano, K Yatsu, S Miyoshi, S Tanaka, K Sato, Y Saitoh, K Hirano, H Maezawa

Affiliations

  1. Plasma Research Centre, University of Tsukuba, Ibaraki 305, Japan.

PMID: 15263683 DOI: 10.1107/S0909049598000016

Abstract

On the basis of a new theory of semiconductor X-ray detector response, a new type of multilayer semiconductor detector was designed and developed for convenient energy analyses of intense incident X-ray flux in a cumulative-current mode. Another anticipated useful property of the developed detector is a drastic improvement in high-energy X-ray response ranging over several hundred eV. The formula for the quantum efficiency of multilayer semiconductor detectors and its physical interpretations are proposed and have been successfully verified by synchrotron radiation experiments at the Photon Factory. These detectors are useful for data analyses under strong radiation-field conditions, including fusion-plasma-emitting X-rays and energetic heavy-particle beams, without the use of high-bias applications.

Publication Types