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Hettler S, Wagner J, Dries M, et al. On the role of inelastic scattering in phase-plate transmission electron microscopy. Ultramicroscopy. 2015;155:27-41doi: 10.1016/j.ultramic.2015.04.001.
Hettler, S., Wagner, J., Dries, M., Oster, M., Wacker, C., Schröder, R. R., & Gerthsen, D. (2015). On the role of inelastic scattering in phase-plate transmission electron microscopy. Ultramicroscopy, 15527-41. https://doi.org/10.1016/j.ultramic.2015.04.001
Hettler, Simon, et al. "On the role of inelastic scattering in phase-plate transmission electron microscopy." Ultramicroscopy vol. 155 (2015): 27-41. doi: https://doi.org/10.1016/j.ultramic.2015.04.001
Hettler S, Wagner J, Dries M, Oster M, Wacker C, Schröder RR, Gerthsen D. On the role of inelastic scattering in phase-plate transmission electron microscopy. Ultramicroscopy. 2015 Aug;155:27-41. doi: 10.1016/j.ultramic.2015.04.001. Epub 2015 Apr 03. PMID: 25879156.
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Ultramicroscopy. 2015 Aug;155:27-41. doi: 10.1016/j.ultramic.2015.04.001. Epub 2015 Apr 03.

On the role of inelastic scattering in phase-plate transmission electron microscopy.

Ultramicroscopy

Simon Hettler, Jochen Wagner, Manuel Dries, Marco Oster, Christian Wacker, Rasmus R Schröder, Dagmar Gerthsen

Affiliations

  1. Laboratorium für Elektronenmikroskopie, Karlsruher Institut für Technologie (KIT), Engesserstr. 7, 76131 Karlsruhe, Germany. Electronic address: [email protected].
  2. Laboratorium für Elektronenmikroskopie, Karlsruher Institut für Technologie (KIT), Engesserstr. 7, 76131 Karlsruhe, Germany.
  3. CellNetworks, BioQuant, Universität Heidelberg, Im Neuenheimer Feld 267, 69120 Heidelberg, Germany.

PMID: 25879156 DOI: 10.1016/j.ultramic.2015.04.001

Abstract

The phase contrast of Au nanoparticles on amorphous-carbon films with different thicknesses is analyzed using an electrostatic Zach phase plate in a Zeiss 912 Ω transmission electron microscope with in-column energy filter. Specifically, unfiltered and plasmon-filtered phase-plate transmission electron microscopy (PP TEM) images are compared to gain insight in the role of coherence after inelastic scattering processes. A considerable phase-contrast contribution resulting from a combined elastic-inelastic scattering process is found in plasmon-filtered PP TEM images. The contrast reduction compared to unfiltered images mainly originates from zero-order beam broadening caused by the inelastic scattering process. The effect of the sequence of the elastic and inelastic scattering processes is studied by varying the position of the nanoparticles, which can be either located on top or at the bottom of the amorphous-carbon film with respect to the incident electron beam direction.

Copyright © 2015 Elsevier B.V. All rights reserved.

Keywords: Coherence; Inelastic scattering; Phase contrast; Phase plate; Plasmon; Transmission electron microscopy

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