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Galvanic Exchange in Colloidal Metal/Metal-Oxide Core/Shell Nanocrystals.

The journal of physical chemistry. C, Nanomaterials and interfaces

Kriegner D, Sytnyk M, Groiss H, Yarema M, Grafeneder W, Walter P, Dippel AC, Meffert M, Gerthsen D, Stangl J, Heiss W.
PMID: 27635186
J Phys Chem C Nanomater Interfaces. 2016 Sep 08;120(35):19848-19855. doi: 10.1021/acs.jpcc.6b06405. Epub 2016 Aug 15.

While galvanic exchange is commonly applied to metallic nanoparticles, recently its applicability was expanded to metal-oxides. Here the galvanic exchange is studied in metal/metal-oxide core/shell nanocrystals. In particular Sn/SnO

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Kriegner D, Sytnyk M, Groiss H, et al. Galvanic Exchange in Colloidal Metal/Metal-Oxide Core/Shell Nanocrystals. J Phys Chem C Nanomater Interfaces. 2016;120(35):19848-19855doi: 10.1021/acs.jpcc.6b06405.
Kriegner, D., Sytnyk, M., Groiss, H., Yarema, M., Grafeneder, W., Walter, P., Dippel, A. C., Meffert, M., Gerthsen, D., Stangl, J., & Heiss, W. (2016). Galvanic Exchange in Colloidal Metal/Metal-Oxide Core/Shell Nanocrystals. The journal of physical chemistry. C, Nanomaterials and interfaces, 120(35), 19848-19855. https://doi.org/10.1021/acs.jpcc.6b06405
Kriegner, Dominik, et al. "Galvanic Exchange in Colloidal Metal/Metal-Oxide Core/Shell Nanocrystals." The journal of physical chemistry. C, Nanomaterials and interfaces vol. 120,35 (2016): 19848-19855. doi: https://doi.org/10.1021/acs.jpcc.6b06405
Kriegner D, Sytnyk M, Groiss H, Yarema M, Grafeneder W, Walter P, Dippel AC, Meffert M, Gerthsen D, Stangl J, Heiss W. Galvanic Exchange in Colloidal Metal/Metal-Oxide Core/Shell Nanocrystals. J Phys Chem C Nanomater Interfaces. 2016 Sep 08;120(35):19848-19855. doi: 10.1021/acs.jpcc.6b06405. Epub 2016 Aug 15. PMID: 27635186; PMCID: PMC5018861.
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Luminescence mechanisms of defective ZnO nanoparticles.

Physical chemistry chemical physics : PCCP

Camarda P, Messina F, Vaccaro L, Agnello S, Buscarino G, Schneider R, Popescu R, Gerthsen D, Lorenzi R, Gelardi FM, Cannas M.
PMID: 27251452
Phys Chem Chem Phys. 2016 Jun 28;18(24):16237-44. doi: 10.1039/c6cp01513a. Epub 2016 Jun 02.

ZnO nanoparticles (NPs) synthesized by pulsed laser ablation (PLAL) of a zinc plate in deionized water were investigated by time-resolved photoluminescence (PL) and complementary techniques (TEM, AFM, μRaman). HRTEM images show that PLAL produces crystalline ZnO NPs in wurtzite...

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Camarda P, Messina F, Vaccaro L, et al. Luminescence mechanisms of defective ZnO nanoparticles. Phys Chem Chem Phys. 2016;18(24):16237-44doi: 10.1039/c6cp01513a.
Camarda, P., Messina, F., Vaccaro, L., Agnello, S., Buscarino, G., Schneider, R., Popescu, R., Gerthsen, D., Lorenzi, R., Gelardi, F. M., & Cannas, M. (2016). Luminescence mechanisms of defective ZnO nanoparticles. Physical chemistry chemical physics : PCCP, 18(24), 16237-44. https://doi.org/10.1039/c6cp01513a
Camarda, Pietro, et al. "Luminescence mechanisms of defective ZnO nanoparticles." Physical chemistry chemical physics : PCCP vol. 18,24 (2016): 16237-44. doi: https://doi.org/10.1039/c6cp01513a
Camarda P, Messina F, Vaccaro L, Agnello S, Buscarino G, Schneider R, Popescu R, Gerthsen D, Lorenzi R, Gelardi FM, Cannas M. Luminescence mechanisms of defective ZnO nanoparticles. Phys Chem Chem Phys. 2016 Jun 28;18(24):16237-44. doi: 10.1039/c6cp01513a. Epub 2016 Jun 02. PMID: 27251452.
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On the role of inelastic scattering in phase-plate transmission electron microscopy.

Ultramicroscopy

Hettler S, Wagner J, Dries M, Oster M, Wacker C, Schröder RR, Gerthsen D.
PMID: 25879156
Ultramicroscopy. 2015 Aug;155:27-41. doi: 10.1016/j.ultramic.2015.04.001. Epub 2015 Apr 03.

The phase contrast of Au nanoparticles on amorphous-carbon films with different thicknesses is analyzed using an electrostatic Zach phase plate in a Zeiss 912 Ω transmission electron microscope with in-column energy filter. Specifically, unfiltered and plasmon-filtered phase-plate transmission electron...

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Hettler S, Wagner J, Dries M, et al. On the role of inelastic scattering in phase-plate transmission electron microscopy. Ultramicroscopy. 2015;155:27-41doi: 10.1016/j.ultramic.2015.04.001.
Hettler, S., Wagner, J., Dries, M., Oster, M., Wacker, C., Schröder, R. R., & Gerthsen, D. (2015). On the role of inelastic scattering in phase-plate transmission electron microscopy. Ultramicroscopy, 15527-41. https://doi.org/10.1016/j.ultramic.2015.04.001
Hettler, Simon, et al. "On the role of inelastic scattering in phase-plate transmission electron microscopy." Ultramicroscopy vol. 155 (2015): 27-41. doi: https://doi.org/10.1016/j.ultramic.2015.04.001
Hettler S, Wagner J, Dries M, Oster M, Wacker C, Schröder RR, Gerthsen D. On the role of inelastic scattering in phase-plate transmission electron microscopy. Ultramicroscopy. 2015 Aug;155:27-41. doi: 10.1016/j.ultramic.2015.04.001. Epub 2015 Apr 03. PMID: 25879156.
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Bulk heterojunction nanomorphology of fluorenyl hexa-peri-hexabenzocoronene-fullerene blend films.

ACS applied materials & interfaces

Pfaff M, Müller P, Bockstaller P, Müller E, Subbiah J, Wong WW, Klein MF, Kiersnowski A, Puniredd SR, Pisula W, Colsmann A, Gerthsen D, Jones DJ.
PMID: 24143919
ACS Appl Mater Interfaces. 2013 Nov 27;5(22):11554-62. doi: 10.1021/am4044085. Epub 2013 Nov 05.

In this study, the nanomorphology of fluorenyl hexa-peri-hexabenzocoronene:[6,6]-phenyl C61-butyric acid methyl ester (FHBC:PC61BM) absorber layers of organic solar cells was investigated. Different electron microscopical techniques, atomic force microscopy, and grazing incidence wide-angle X-ray scattering were applied for a comprehensive...

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Pfaff M, Müller P, Bockstaller P, et al. Bulk heterojunction nanomorphology of fluorenyl hexa-peri-hexabenzocoronene-fullerene blend films. ACS Appl Mater Interfaces. 2013;5(22):11554-62doi: 10.1021/am4044085.
Pfaff, M., Müller, P., Bockstaller, P., Müller, E., Subbiah, J., Wong, W. W., Klein, M. F., Kiersnowski, A., Puniredd, S. R., Pisula, W., Colsmann, A., Gerthsen, D., & Jones, D. J. (2013). Bulk heterojunction nanomorphology of fluorenyl hexa-peri-hexabenzocoronene-fullerene blend films. ACS applied materials & interfaces, 5(22), 11554-62. https://doi.org/10.1021/am4044085
Pfaff, Marina, et al. "Bulk heterojunction nanomorphology of fluorenyl hexa-peri-hexabenzocoronene-fullerene blend films." ACS applied materials & interfaces vol. 5,22 (2013): 11554-62. doi: https://doi.org/10.1021/am4044085
Pfaff M, Müller P, Bockstaller P, Müller E, Subbiah J, Wong WW, Klein MF, Kiersnowski A, Puniredd SR, Pisula W, Colsmann A, Gerthsen D, Jones DJ. Bulk heterojunction nanomorphology of fluorenyl hexa-peri-hexabenzocoronene-fullerene blend films. ACS Appl Mater Interfaces. 2013 Nov 27;5(22):11554-62. doi: 10.1021/am4044085. Epub 2013 Nov 05. PMID: 24143919.
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Sample thickness determination by scanning transmission electron microscopy at low electron energies.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

Volkenandt T, Müller E, Gerthsen D.
PMID: 24331292
Microsc Microanal. 2014 Feb;20(1):111-23. doi: 10.1017/S1431927613013913. Epub 2013 Dec 13.

Sample thickness is a decisive parameter for any quantification of image information and composition in transmission electron microscopy. In this context, we present a method to determine the local sample thickness by scanning transmission electron microscopy at primary energies...

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Volkenandt T, Müller E, Gerthsen D. Sample thickness determination by scanning transmission electron microscopy at low electron energies. Microsc Microanal. 2013;20(1):111-23doi: 10.1017/S1431927613013913.
Volkenandt, T., Müller, E., & Gerthsen, D. (2014). Sample thickness determination by scanning transmission electron microscopy at low electron energies. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 20(1), 111-23. https://doi.org/10.1017/S1431927613013913
Volkenandt, Tobias, et al. "Sample thickness determination by scanning transmission electron microscopy at low electron energies." Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 20,1 (2014): 111-23. doi: https://doi.org/10.1017/S1431927613013913
Volkenandt T, Müller E, Gerthsen D. Sample thickness determination by scanning transmission electron microscopy at low electron energies. Microsc Microanal. 2014 Feb;20(1):111-23. doi: 10.1017/S1431927613013913. Epub 2013 Dec 13. PMID: 24331292.
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Reactivity of 3-Oxo-β-lactams with Respect to Primary Amines-An Experimental and Computational Approach.

Chemistry (Weinheim an der Bergstrasse, Germany)

Piens N, Goossens H, Hertsen D, Deketelaere S, Crul L, Demeurisse L, De Moor J, Van den Broeck E, Mollet K, Van Hecke K, Van Speybroeck V, D'hooghe M.
PMID: 29024090
Chemistry. 2017 Dec 19;23(71):18002-18009. doi: 10.1002/chem.201703852. Epub 2017 Dec 04.

The reactivity of 3-oxo-β-lactams with respect to primary amines was investigated in depth. Depending on the specific azetidin-2-one C4 substituent, this reaction was shown to selectively produce 3-imino-β-lactams (through dehydration), α-aminoamides (through CO elimination), or ethanediamides (through an unprecedented...

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Piens N, Goossens H, Hertsen D, et al. Reactivity of 3-Oxo-β-lactams with Respect to Primary Amines-An Experimental and Computational Approach. Chemistry. 2017;23(71):18002-18009doi: 10.1002/chem.201703852.
Piens, N., Goossens, H., Hertsen, D., Deketelaere, S., Crul, L., Demeurisse, L., De Moor, J., Van den Broeck, E., Mollet, K., Van Hecke, K., Van Speybroeck, V., & D'hooghe, M. (2017). Reactivity of 3-Oxo-β-lactams with Respect to Primary Amines-An Experimental and Computational Approach. Chemistry (Weinheim an der Bergstrasse, Germany), 23(71), 18002-18009. https://doi.org/10.1002/chem.201703852
Piens, Nicola, et al. "Reactivity of 3-Oxo-β-lactams with Respect to Primary Amines-An Experimental and Computational Approach." Chemistry (Weinheim an der Bergstrasse, Germany) vol. 23,71 (2017): 18002-18009. doi: https://doi.org/10.1002/chem.201703852
Piens N, Goossens H, Hertsen D, Deketelaere S, Crul L, Demeurisse L, De Moor J, Van den Broeck E, Mollet K, Van Hecke K, Van Speybroeck V, D'hooghe M. Reactivity of 3-Oxo-β-lactams with Respect to Primary Amines-An Experimental and Computational Approach. Chemistry. 2017 Dec 19;23(71):18002-18009. doi: 10.1002/chem.201703852. Epub 2017 Dec 04. PMID: 29024090.
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Influence of Solvation and Dynamics on the Mechanism and Kinetics of Nucleophilic Aromatic Substitution Reactions in Liquid Ammonia.

The Journal of organic chemistry

Moors SL, Brigou B, Hertsen D, Pinter B, Geerlings P, Van Speybroeck V, Catak S, De Proft F.
PMID: 26800020
J Org Chem. 2016 Feb 19;81(4):1635-44. doi: 10.1021/acs.joc.5b02794. Epub 2016 Feb 05.

The role of the solvent and the influence of dynamics on the kinetics and mechanism of the SNAr reaction of several halonitrobenzenes in liquid ammonia, using both static calculations and dynamic ab initio molecular dynamics simulations, are investigated. A...

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Moors SL, Brigou B, Hertsen D, et al. Influence of Solvation and Dynamics on the Mechanism and Kinetics of Nucleophilic Aromatic Substitution Reactions in Liquid Ammonia. J Org Chem. 2016;81(4):1635-44doi: 10.1021/acs.joc.5b02794.
Moors, S. L., Brigou, B., Hertsen, D., Pinter, B., Geerlings, P., Van Speybroeck, V., Catak, S., & De Proft, F. (2016). Influence of Solvation and Dynamics on the Mechanism and Kinetics of Nucleophilic Aromatic Substitution Reactions in Liquid Ammonia. The Journal of organic chemistry, 81(4), 1635-44. https://doi.org/10.1021/acs.joc.5b02794
Moors, Samuel L C, et al. "Influence of Solvation and Dynamics on the Mechanism and Kinetics of Nucleophilic Aromatic Substitution Reactions in Liquid Ammonia." The Journal of organic chemistry vol. 81,4 (2016): 1635-44. doi: https://doi.org/10.1021/acs.joc.5b02794
Moors SL, Brigou B, Hertsen D, Pinter B, Geerlings P, Van Speybroeck V, Catak S, De Proft F. Influence of Solvation and Dynamics on the Mechanism and Kinetics of Nucleophilic Aromatic Substitution Reactions in Liquid Ammonia. J Org Chem. 2016 Feb 19;81(4):1635-44. doi: 10.1021/acs.joc.5b02794. Epub 2016 Feb 05. PMID: 26800020.
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Sodium-Naphthalenide-Driven Synthesis of Base-Metal Nanoparticles and Follow-up Reactions.

Angewandte Chemie (International ed. in English)

Schöttle C, Bockstaller P, Popescu R, Gerthsen D, Feldmann C.
PMID: 26190645
Angew Chem Int Ed Engl. 2015 Aug 17;54(34):9866-70. doi: 10.1002/anie.201503269. Epub 2015 Jul 15.

Mo(0), W(0), Fe(0), Ru(0), Re(0), and Zn(0) nanoparticles—essentially base metals—are prepared as a general strategy by a sodium naphthalenide ([NaNaph])-driven reduction of simple metal chlorides in ethers (1,2-dimethoxyethane (DME), tetrahydrofuran (THF)). All the nanoparticles have diameters ≤10 nm, and...

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Schöttle C, Bockstaller P, Popescu R, et al. Sodium-Naphthalenide-Driven Synthesis of Base-Metal Nanoparticles and Follow-up Reactions. Angew Chem Int Ed Engl. 2015;54(34):9866-70doi: 10.1002/anie.201503269.
Schöttle, C., Bockstaller, P., Popescu, R., Gerthsen, D., & Feldmann, C. (2015). Sodium-Naphthalenide-Driven Synthesis of Base-Metal Nanoparticles and Follow-up Reactions. Angewandte Chemie (International ed. in English), 54(34), 9866-70. https://doi.org/10.1002/anie.201503269
Schöttle, Christian, et al. "Sodium-Naphthalenide-Driven Synthesis of Base-Metal Nanoparticles and Follow-up Reactions." Angewandte Chemie (International ed. in English) vol. 54,34 (2015): 9866-70. doi: https://doi.org/10.1002/anie.201503269
Schöttle C, Bockstaller P, Popescu R, Gerthsen D, Feldmann C. Sodium-Naphthalenide-Driven Synthesis of Base-Metal Nanoparticles and Follow-up Reactions. Angew Chem Int Ed Engl. 2015 Aug 17;54(34):9866-70. doi: 10.1002/anie.201503269. Epub 2015 Jul 15. PMID: 26190645.
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Dopant-Site Determination in Y- and Sc-Doped (Ba0.5Sr0.5)(Co0.8Fe0.2)O3-δ by Atom Location by Channeling Enhanced Microanalysis and the Role of Dopant Site on Secondary Phase Formation.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

Meffert M, Störmer H, Gerthsen D.
PMID: 26689355
Microsc Microanal. 2016 Feb;22(1):113-21. doi: 10.1017/S1431927615015536. Epub 2015 Dec 22.

(Ba0.5Sr0.5)(Co0.8Fe0.2)O3-δ (BSCF) is a promising material with mixed ionic and electronic conductivity which is considered for oxygen separation membranes. Selective improvement of material properties, e.g. oxygen diffusivity or suppression of secondary phase formation, can be achieved by B-site doping....

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Meffert M, Störmer H, Gerthsen D. Dopant-Site Determination in Y- and Sc-Doped (Ba0.5Sr0.5)(Co0.8Fe0.2)O3-δ by Atom Location by Channeling Enhanced Microanalysis and the Role of Dopant Site on Secondary Phase Formation. Microsc Microanal. 2015;22(1):113-21doi: 10.1017/S1431927615015536.
Meffert, M., Störmer, H., & Gerthsen, D. (2016). Dopant-Site Determination in Y- and Sc-Doped (Ba0.5Sr0.5)(Co0.8Fe0.2)O3-δ by Atom Location by Channeling Enhanced Microanalysis and the Role of Dopant Site on Secondary Phase Formation. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 22(1), 113-21. https://doi.org/10.1017/S1431927615015536
Meffert, Matthias, et al. "Dopant-Site Determination in Y- and Sc-Doped (Ba0.5Sr0.5)(Co0.8Fe0.2)O3-δ by Atom Location by Channeling Enhanced Microanalysis and the Role of Dopant Site on Secondary Phase Formation." Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 22,1 (2016): 113-21. doi: https://doi.org/10.1017/S1431927615015536
Meffert M, Störmer H, Gerthsen D. Dopant-Site Determination in Y- and Sc-Doped (Ba0.5Sr0.5)(Co0.8Fe0.2)O3-δ by Atom Location by Channeling Enhanced Microanalysis and the Role of Dopant Site on Secondary Phase Formation. Microsc Microanal. 2016 Feb;22(1):113-21. doi: 10.1017/S1431927615015536. Epub 2015 Dec 22. PMID: 26689355.
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Determination of the mean inner potential in III-V semiconductors, Si and Ge by density functional theory and electron holography.

Ultramicroscopy

Kruse P, Schowalter M, Lamoen D, Rosenauer A, Gerthsen D.
PMID: 16125323
Ultramicroscopy. 2006 Jan;106(2):105-13. doi: 10.1016/j.ultramic.2005.06.057. Epub 2005 Jul 28.

The mean inner potentials of various III-V semiconductors, Si and Ge have been calculated by density functional theory methods. For that purpose, the Coulomb potential of slabs consisting of a crystal and vacuum region has been computed and averaged...

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Kruse P, Schowalter M, Lamoen D, et al. Determination of the mean inner potential in III-V semiconductors, Si and Ge by density functional theory and electron holography. Ultramicroscopy. 2005;106(2):105-13doi: 10.1016/j.ultramic.2005.06.057.
Kruse, P., Schowalter, M., Lamoen, D., Rosenauer, A., & Gerthsen, D. (2006). Determination of the mean inner potential in III-V semiconductors, Si and Ge by density functional theory and electron holography. Ultramicroscopy, 106(2), 105-13. https://doi.org/10.1016/j.ultramic.2005.06.057
Kruse, P, et al. "Determination of the mean inner potential in III-V semiconductors, Si and Ge by density functional theory and electron holography." Ultramicroscopy vol. 106,2 (2006): 105-13. doi: https://doi.org/10.1016/j.ultramic.2005.06.057
Kruse P, Schowalter M, Lamoen D, Rosenauer A, Gerthsen D. Determination of the mean inner potential in III-V semiconductors, Si and Ge by density functional theory and electron holography. Ultramicroscopy. 2006 Jan;106(2):105-13. doi: 10.1016/j.ultramic.2005.06.057. Epub 2005 Jul 28. PMID: 16125323.
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EELS investigations of different niobium oxide phases.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

Bach D, Störmer H, Schneider R, Gerthsen D, Verbeeck J.
PMID: 16984668
Microsc Microanal. 2006 Oct;12(5):416-23. doi: 10.1017/S1431927606060521.

Electron energy loss spectra in conjunction with near-edge fine structures of purely stoichiometric niobium monoxide (NbO) and niobium pentoxide (Nb2O5) reference materials were recorded. The structures of the niobium oxide reference materials were checked by selected area electron diffraction...

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Bach D, Störmer H, Schneider R, et al. EELS investigations of different niobium oxide phases. Microsc Microanal. 2006;12(5):416-23doi: 10.1017/S1431927606060521.
Bach, D., Störmer, H., Schneider, R., Gerthsen, D., & Verbeeck, J. (2006). EELS investigations of different niobium oxide phases. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 12(5), 416-23. https://doi.org/10.1017/S1431927606060521
Bach, D, et al. "EELS investigations of different niobium oxide phases." Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada vol. 12,5 (2006): 416-23. doi: https://doi.org/10.1017/S1431927606060521
Bach D, Störmer H, Schneider R, Gerthsen D, Verbeeck J. EELS investigations of different niobium oxide phases. Microsc Microanal. 2006 Oct;12(5):416-23. doi: 10.1017/S1431927606060521. PMID: 16984668.
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Focused ion beam preparation of atom probe specimens containing a single crystallographically well-defined grain boundary.

Micron (Oxford, England : 1993)

Pérez-Willard F, Wolde-Giorgis D, Al-Kassab T, López GA, Mittemeijer EJ, Kirchheim R, Gerthsen D.
PMID: 17331735
Micron. 2008;39(1):45-52. doi: 10.1016/j.micron.2007.01.001. Epub 2007 Jan 20.

Needle-shaped atom probe specimens containing a single grain boundary were produced using the focused ion beam (FIB) of a two-beam FIB/SEM (scanning electron microscope) system. The presented specimen preparation approach allows the unprecedented study of a grain boundary which...

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Pérez-Willard F, Wolde-Giorgis D, Al-Kassab T, et al. Focused ion beam preparation of atom probe specimens containing a single crystallographically well-defined grain boundary. Micron. 2007;39(1):45-52doi: 10.1016/j.micron.2007.01.001.
Pérez-Willard, F., Wolde-Giorgis, D., Al-Kassab, T., López, G. A., Mittemeijer, E. J., Kirchheim, R., & Gerthsen, D. (2008). Focused ion beam preparation of atom probe specimens containing a single crystallographically well-defined grain boundary. Micron (Oxford, England : 1993), 39(1), 45-52. https://doi.org/10.1016/j.micron.2007.01.001
Pérez-Willard, Fabián, et al. "Focused ion beam preparation of atom probe specimens containing a single crystallographically well-defined grain boundary." Micron (Oxford, England : 1993) vol. 39,1 (2008): 45-52. doi: https://doi.org/10.1016/j.micron.2007.01.001
Pérez-Willard F, Wolde-Giorgis D, Al-Kassab T, López GA, Mittemeijer EJ, Kirchheim R, Gerthsen D. Focused ion beam preparation of atom probe specimens containing a single crystallographically well-defined grain boundary. Micron. 2008;39(1):45-52. doi: 10.1016/j.micron.2007.01.001. Epub 2007 Jan 20. PMID: 17331735.
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Showing 1 to 12 of 92 entries