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DelRio FW, White RM, Krylyuk S, et al. Near-theoretical fracture strengths in native and oxidized silicon nanowires. Nanotechnology. 2016;27(31):31LT02doi: 10.1088/0957-4484/27/31/31LT02.
DelRio, F. W., White, R. M., Krylyuk, S., Davydov, A. V., Friedman, L. H., & Cook, R. F. (2016). Near-theoretical fracture strengths in native and oxidized silicon nanowires. Nanotechnology, 27(31), 31LT02. https://doi.org/10.1088/0957-4484/27/31/31LT02
DelRio, Frank W, et al. "Near-theoretical fracture strengths in native and oxidized silicon nanowires." Nanotechnology vol. 27,31 (2016): 31LT02. doi: https://doi.org/10.1088/0957-4484/27/31/31LT02
DelRio FW, White RM, Krylyuk S, Davydov AV, Friedman LH, Cook RF. Near-theoretical fracture strengths in native and oxidized silicon nanowires. Nanotechnology. 2016 Aug 05;27(31):31LT02. doi: 10.1088/0957-4484/27/31/31LT02. Epub 2016 Jun 21. PMID: 27325151.
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