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Zhong H, Zhang J, Tang X, et al. Mass spectrometric monitoring of interfacial photoelectron transfer and imaging of active crystalline facets of semiconductors. Nat Commun. 2017;8:14524doi: 10.1038/ncomms14524.
Zhong, H., Zhang, J., Tang, X., Zhang, W., Jiang, R., Li, R., Chen, D., Wang, P., & Yuan, Z. (2017). Mass spectrometric monitoring of interfacial photoelectron transfer and imaging of active crystalline facets of semiconductors. Nature communications, 814524. https://doi.org/10.1038/ncomms14524
Zhong, Hongying, et al. "Mass spectrometric monitoring of interfacial photoelectron transfer and imaging of active crystalline facets of semiconductors." Nature communications vol. 8 (2017): 14524. doi: https://doi.org/10.1038/ncomms14524
Zhong H, Zhang J, Tang X, Zhang W, Jiang R, Li R, Chen D, Wang P, Yuan Z. Mass spectrometric monitoring of interfacial photoelectron transfer and imaging of active crystalline facets of semiconductors. Nat Commun. 2017 Feb 22;8:14524. doi: 10.1038/ncomms14524. PMID: 28224986; PMCID: PMC5322523.
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