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Engelhorn K, Hilsabeck TJ, Kilkenny J, et al. Sub-nanosecond single line-of-sight (SLOS) x-ray imagers (invited). Rev Sci Instrum. 2018;89(10):10G123doi: 10.1063/1.5039648.
Engelhorn, K., Hilsabeck, T. J., Kilkenny, J., Morris, D., Chung, T. M., Dymoke-Bradshaw, A., Hares, J. D., Bell, P., Bradley, D., Carpenter, A. C., Dayton, M., Nagel, S. R., Claus, L., Porter, J., Rochau, G., Sanchez, M., Ivancic, S., Sorce, C., & Theobald, W. (2018). Sub-nanosecond single line-of-sight (SLOS) x-ray imagers (invited). The Review of scientific instruments, 89(10), 10G123. https://doi.org/10.1063/1.5039648
Engelhorn, K, et al. "Sub-nanosecond single line-of-sight (SLOS) x-ray imagers (invited)." The Review of scientific instruments vol. 89,10 (2018): 10G123. doi: https://doi.org/10.1063/1.5039648
Engelhorn K, Hilsabeck TJ, Kilkenny J, Morris D, Chung TM, Dymoke-Bradshaw A, Hares JD, Bell P, Bradley D, Carpenter AC, Dayton M, Nagel SR, Claus L, Porter J, Rochau G, Sanchez M, Ivancic S, Sorce C, Theobald W. Sub-nanosecond single line-of-sight (SLOS) x-ray imagers (invited). Rev Sci Instrum. 2018 Oct;89(10):10G123. doi: 10.1063/1.5039648. PMID: 30399697.
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Rev Sci Instrum. 2018 Oct;89(10):10G123. doi: 10.1063/1.5039648.

Sub-nanosecond single line-of-sight (SLOS) x-ray imagers (invited).

The Review of scientific instruments

K Engelhorn, T J Hilsabeck, J Kilkenny, D Morris, T M Chung, A Dymoke-Bradshaw, J D Hares, P Bell, D Bradley, A C Carpenter, M Dayton, S R Nagel, L Claus, J Porter, G Rochau, M Sanchez, S Ivancic, C Sorce, W Theobald

Affiliations

  1. General Atomics, San Diego, California 92121, USA.
  2. TMC2 Innovations LLC, Murrieta, California 92563, USA.
  3. Kentech Instruments Ltd., Wallingford, Oxfordshire OX10 8BD, United Kingdom.
  4. Lawrence Livermore National Laboratory, Livermore, California 94550, USA.
  5. Sandia National Laboratories, Albuquerque, New Mexico 87185, USA.
  6. Laboratory for Laser Energetics, Rochester, New York 14623, USA.

PMID: 30399697 DOI: 10.1063/1.5039648

Abstract

A new generation of fast-gated x-ray framing cameras have been developed that are capable of capturing multiple frames along a single line-of-sight with 30 ps temporal resolution. The instruments are constructed by integrating pulse-dilation electron imaging with burst mode hybrid-complimentary metal-oxide-semiconductor sensors. Two such instruments have been developed, characterized, and fielded at the National Ignition Facility and the OMEGA laser. These instruments are particularly suited for advanced x-ray imaging applications in Inertial Confinement Fusion and High energy density experiments. Here, we discuss the system architecture and the techniques required for tuning the instruments to achieve optimal performance. Characterization results are also presented along with planned future improvements to the design.

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