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Zhang C, Hong N, Ji C, et al. Robust Extraction of Hyperbolic Metamaterial Permittivity using Total Internal Reflection Ellipsometry. ACS Photonics. 2018;5doi: 10.1021/acsphotonics.8b00086.
Zhang, C., Hong, N., Ji, C., Zhu, W., Chen, X., Agrawal, A., Zhang, Z., Tiwald, T. E., Schoeche, S., Hilfiker, J. N., Guo, L. J., & Lezec, H. J. (2018). Robust Extraction of Hyperbolic Metamaterial Permittivity using Total Internal Reflection Ellipsometry. ACS photonics, 5. https://doi.org/10.1021/acsphotonics.8b00086
Zhang, Cheng, et al. "Robust Extraction of Hyperbolic Metamaterial Permittivity using Total Internal Reflection Ellipsometry." ACS photonics vol. 5 (2018). doi: https://doi.org/10.1021/acsphotonics.8b00086
Zhang C, Hong N, Ji C, Zhu W, Chen X, Agrawal A, Zhang Z, Tiwald TE, Schoeche S, Hilfiker JN, Guo LJ, Lezec HJ. Robust Extraction of Hyperbolic Metamaterial Permittivity using Total Internal Reflection Ellipsometry. ACS Photonics. 2018;5. doi: 10.1021/acsphotonics.8b00086. PMID: 30997368; PMCID: PMC6463533.
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ACS Photonics. 2018;5. doi: 10.1021/acsphotonics.8b00086.

Robust Extraction of Hyperbolic Metamaterial Permittivity using Total Internal Reflection Ellipsometry.

ACS photonics

Cheng Zhang, Nina Hong, Chengang Ji, Wenqi Zhu, Xi Chen, Amit Agrawal, Zhong Zhang, Tom E Tiwald, Stefan Schoeche, James N Hilfiker, L Jay Guo, Henri J Lezec

Affiliations

  1. Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA.
  2. Maryland Nanocenter, University of Maryland, College Park, MD, 20742, USA.
  3. J. A. Woollam Co., Inc., Lincoln, NE, 68508, USA.
  4. Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI, 48105, USA.

PMID: 30997368 PMCID: PMC6463533 DOI: 10.1021/acsphotonics.8b00086

Abstract

Hyperbolic metamaterials are optical materials characterized by highly anisotropic effective permittivity tensor components having opposite signs along orthogonal directions. The techniques currently employed for characterizing the optical properties of hyperbolic metamaterials are limited in their capability for robust extraction of the complex permittivity tensor. Here we demonstrate how an ellipsometry technique based on total internal reflection can be leveraged to extract the permittivity of hyperbolic metamaterials with improved robustness and accuracy. By enhancing the interaction of light with the metamaterial stacks, improved ellipsometric sensitivity for subsequent permittivity extraction is obtained. The technique does not require any modification of the hyperbolic metamaterial sample or sophisticated ellipsometry set-up, and could therefore serve as a reliable and easy-to-adopt technique for characterization of a broad class of anisotropic metamaterials.

Keywords: anisotropic metamaterial; hyperbolic metamaterial; spectroscopic ellipsometry; total internal reflection ellipsometry

Conflict of interest statement

The authors declare no competing financial interest.

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