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Kim TH, Kim HR, Cho YJ. Product Inspection Methodology via Deep Learning: An Overview. Sensors (Basel). 2021;21(15)doi: 10.3390/s21155039.
Kim, T. H., Kim, H. R., & Cho, Y. J. (2021). Product Inspection Methodology via Deep Learning: An Overview. Sensors (Basel, Switzerland), 21(15), . https://doi.org/10.3390/s21155039
Kim, Tae-Hyun, et al. "Product Inspection Methodology via Deep Learning: An Overview." Sensors (Basel, Switzerland) vol. 21,15 (2021). doi: https://doi.org/10.3390/s21155039
Kim TH, Kim HR, Cho YJ. Product Inspection Methodology via Deep Learning: An Overview. Sensors (Basel). 2021 Jul 25;21(15). doi: 10.3390/s21155039. PMID: 34372276; PMCID: PMC8346960.
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