Joint non-rigid image registration and reconstruction for quantitative atomic resolution scanning transmission electron microscopy. Berkels B, Liebscher CH. B Berkels, CH Liebscher - Ultramicroscopy, 2019 - Elsevier GSID: rhxjNcEYov0J
Large area strain analysis using scanning transmission electron microscopy across multiple images. Oni AA, Sang X. AA Oni, X Sang, SV Raju, S Dumpala… - Applied Physics …, 2015 - aip.scitation.org GSID: uaSkNUFmRkQJ
Optimising multi-frame ADF-STEM for high-precision atomic-resolution strain mapping. Jones L, Løvvik OM, Nord M, Wenner S. L Jones, S Wenner, M Nord, PH Ninive, OM Løvvik… - Ultramicroscopy, 2017 - Elsevier GSID: _3b9bUWXW34J
Towards oxide electronics: a roadmap. Coll M, Fontcuberta J. M Coll, J Fontcuberta… - Applied …, 2019 - hal-centralesupelec.archives … GSID: TvLXg_LOe_gJ
Current challenges and opportunities in microstructure-related properties of advanced high-strength steels. Kwiatkowski A, Raabe D, Sun B. D Raabe, B Sun, A Kwiatkowski Da Silva… - … Materials Transactions A, 2020 - Springer GSID: 1fE4wcWIwIcJ
Quantified contribution of β ″and β′ precipitates to the strengthening of an aged Al–Mg–Si alloy. Li K. M Yang, H Chen, A Orekhov, Q Lu, X Lan, K Li… - Materials Science and …, 2020 - Elsevier GSID: U7j4wSPlShMJ