Studies of x-ray localization and thickness dependence in atomic-scale elemental mapping by STEM energy-dispersive x-ray spectroscopy using single-frame …. Lu P, Moya JM, Yuan R, Zuo JM. P Lu, JM Moya, R Yuan, JM Zuo - Ultramicroscopy, 2018 - Elsevier GSID: Dw0MY6I4LBQJ
Chemical quantification of atomic-scale EDS maps under thin specimen conditions. Lee S, Lu P. P Lu, E Romero, S Lee… - Microscopy and …, 2014 - academic.oup.com GSID: CDROWLseAfoJ
Fast atomic-scale elemental mapping of crystalline materials by STEM energy-dispersive X-ray spectroscopy achieved with thin specimens. Lu P, Yuan R, Zuo JM. P Lu, R Yuan, JM Zuo - Microscopy and Microanalysis, 2017 - cambridge.org GSID: iJ0hUs-vLkoJ
Moiré fringe method via scanning transmission electron microscopy. Ke X, Su D. X Ke, M Zhang, K Zhao, D Su - Small Methods, 2022 - Wiley Online Library GSID: C-PrkfHEAZ4J
Correlative STEM-APT characterization of radiation-induced segregation and precipitation of in-service BWR 304 stainless steel. Lach TG, Olszta MJ, Taylor SD, Yano KH. TG Lach, MJ Olszta, SD Taylor, KH Yano… - Journal of Nuclear …, 2021 - Elsevier GSID: n7IHXDBjZGwJ
Advances and applications of atomic-resolution scanning transmission electron microscopy. Liu JJ. JJ Liu - Microscopy and Microanalysis, 2021 - cambridge.org GSID: tlzJI_DAOE8J
