Display options
Share it on
Full text links
American Physical Society

Phys Rev Lett. 1985 Oct 28;55(18):1831-1834. doi: 10.1103/PhysRevLett.55.1831.

Precision Measurement of Electroweak Effects in e+e---> micro+ micro- at sqrt s =29 GeV.

Physical review letters

Ash, Band, Blume, Camporesi, Chadwick, Clearwater, Coombes, Delfino, Fernandez, Ford, Gettner, Goderre, Groom, Heltsley, Hurst, Johnson, Lau, Lavine, Leedy, Lippi, Maruyama, Messner, Moromisato, Moss, Muller, Nelson, Peruzzi, Piccolo, Prepost, Qi, Read, Ritson, Rosenberg, Shambroom, Sleeman, Smith, Venuti, von Goeler E, Wald, Weinstein, Wiser, Zdarko

PMID: 10031938 DOI: 10.1103/PhysRevLett.55.1831

[No abstract available.]

Publication Types

LinkOut - more resources