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Park S, Schultz T, Shin D, et al. The Schottky-Mott Rule Expanded for Two-Dimensional Semiconductors: Influence of Substrate Dielectric Screening. ACS Nano. 2021;15(9):14794-14803doi: 10.1021/acsnano.1c04825.
Park, S., Schultz, T., Shin, D., Mutz, N., Aljarb, A., Kang, H. S., Lee, C. H., Li, L. J., Xu, X., Tung, V., List-Kratochvil, E. J. W., Blumstengel, S., Amsalem, P., & Koch, N. (2021). The Schottky-Mott Rule Expanded for Two-Dimensional Semiconductors: Influence of Substrate Dielectric Screening. ACS nano, 15(9), 14794-14803. https://doi.org/10.1021/acsnano.1c04825
Park, Soohyung, et al. "The Schottky-Mott Rule Expanded for Two-Dimensional Semiconductors: Influence of Substrate Dielectric Screening." ACS nano vol. 15,9 (2021): 14794-14803. doi: https://doi.org/10.1021/acsnano.1c04825
Park S, Schultz T, Shin D, Mutz N, Aljarb A, Kang HS, Lee CH, Li LJ, Xu X, Tung V, List-Kratochvil EJW, Blumstengel S, Amsalem P, Koch N. The Schottky-Mott Rule Expanded for Two-Dimensional Semiconductors: Influence of Substrate Dielectric Screening. ACS Nano. 2021 Sep 28;15(9):14794-14803. doi: 10.1021/acsnano.1c04825. Epub 2021 Aug 11. PMID: 34379410.
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