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Yeh PC, Jin W, Zaki N, et al. Direct Measurement of the Tunable Electronic Structure of Bilayer MoS2 by Interlayer Twist. Nano Lett. 2016;16(2):953-9doi: 10.1021/acs.nanolett.5b03883.
Yeh, P. C., Jin, W., Zaki, N., Kunstmann, J., Chenet, D., Arefe, G., Sadowski, J. T., Dadap, J. I., Sutter, P., Hone, J., & Osgood, R. M. (2016). Direct Measurement of the Tunable Electronic Structure of Bilayer MoS2 by Interlayer Twist. Nano letters, 16(2), 953-9. https://doi.org/10.1021/acs.nanolett.5b03883
Yeh, Po-Chun, et al. "Direct Measurement of the Tunable Electronic Structure of Bilayer MoS2 by Interlayer Twist." Nano letters vol. 16,2 (2016): 953-9. doi: https://doi.org/10.1021/acs.nanolett.5b03883
Yeh PC, Jin W, Zaki N, Kunstmann J, Chenet D, Arefe G, Sadowski JT, Dadap JI, Sutter P, Hone J, Osgood RM. Direct Measurement of the Tunable Electronic Structure of Bilayer MoS2 by Interlayer Twist. Nano Lett. 2016 Feb 10;16(2):953-9. doi: 10.1021/acs.nanolett.5b03883. Epub 2016 Jan 20. PMID: 26760447.
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