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Lange M, Matsumoto J, Setiawan A, et al. Angle-resolving time-of-flight electron spectrometer for near-threshold precision measurements of differential cross sections of electron-impact excitation of atoms and molecules. Rev Sci Instrum. 2008;79(4):043105doi: 10.1063/1.2912824.
Lange, M., Matsumoto, J., Setiawan, A., Panajotović, R., Harrison, J., Lower, J. C., Newman, D. S., Mondal, S., & Buckman, S. J. (2008). Angle-resolving time-of-flight electron spectrometer for near-threshold precision measurements of differential cross sections of electron-impact excitation of atoms and molecules. The Review of scientific instruments, 79(4), 043105. https://doi.org/10.1063/1.2912824
Lange, M, et al. "Angle-resolving time-of-flight electron spectrometer for near-threshold precision measurements of differential cross sections of electron-impact excitation of atoms and molecules." The Review of scientific instruments vol. 79,4 (2008): 043105. doi: https://doi.org/10.1063/1.2912824
Lange M, Matsumoto J, Setiawan A, Panajotović R, Harrison J, Lower JC, Newman DS, Mondal S, Buckman SJ. Angle-resolving time-of-flight electron spectrometer for near-threshold precision measurements of differential cross sections of electron-impact excitation of atoms and molecules. Rev Sci Instrum. 2008 Apr;79(4):043105. doi: 10.1063/1.2912824. PMID: 18447521.
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