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Le Febvrier A, Galca AC, Corredores Y, et al. Structural, optical, and dielectric properties of Bi(1.5-x)Zn(0.92-y)Nb(1.5)O(6.92-δ) thin films grown by PLD on R-plane sapphire and LaAlO3 substrates. ACS Appl Mater Interfaces. 2012;4(10):5227-33doi: 10.1021/am301152r.
Le Febvrier, A., Galca, A. C., Corredores, Y., Députier, S., Bouquet, V., Demange, V., Castel, X., Sauleau, R., Lefort, R., Zhang, L. Y., Tanné, G., Pintilie, L., & Guilloux-Viry, M. (2012). Structural, optical, and dielectric properties of Bi(1.5-x)Zn(0.92-y)Nb(1.5)O(6.92-δ) thin films grown by PLD on R-plane sapphire and LaAlO3 substrates. ACS applied materials & interfaces, 4(10), 5227-33. https://doi.org/10.1021/am301152r
Le Febvrier, A, et al. "Structural, optical, and dielectric properties of Bi(1.5-x)Zn(0.92-y)Nb(1.5)O(6.92-δ) thin films grown by PLD on R-plane sapphire and LaAlO3 substrates." ACS applied materials & interfaces vol. 4,10 (2012): 5227-33. doi: https://doi.org/10.1021/am301152r
Le Febvrier A, Galca AC, Corredores Y, Députier S, Bouquet V, Demange V, Castel X, Sauleau R, Lefort R, Zhang LY, Tanné G, Pintilie L, Guilloux-Viry M. Structural, optical, and dielectric properties of Bi(1.5-x)Zn(0.92-y)Nb(1.5)O(6.92-δ) thin films grown by PLD on R-plane sapphire and LaAlO3 substrates. ACS Appl Mater Interfaces. 2012 Oct 24;4(10):5227-33. doi: 10.1021/am301152r. Epub 2012 Oct 08. PMID: 22994246.
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