Cite
Böttger S, Hermann S, Schulz SE, et al. Length separation of single-walled carbon nanotubes and its impact on structural and electrical properties of wafer-level fabricated carbon nanotube-field-effect transistors. Nanotechnology. 2016;27(43):435203doi: 10.1088/0957-4484/27/43/435203.
Böttger, S., Hermann, S., Schulz, S. E., & Gessner, T. (2016). Length separation of single-walled carbon nanotubes and its impact on structural and electrical properties of wafer-level fabricated carbon nanotube-field-effect transistors. Nanotechnology, 27(43), 435203. https://doi.org/10.1088/0957-4484/27/43/435203
Böttger, Simon, et al. "Length separation of single-walled carbon nanotubes and its impact on structural and electrical properties of wafer-level fabricated carbon nanotube-field-effect transistors." Nanotechnology vol. 27,43 (2016): 435203. doi: https://doi.org/10.1088/0957-4484/27/43/435203
Böttger S, Hermann S, Schulz SE, Gessner T. Length separation of single-walled carbon nanotubes and its impact on structural and electrical properties of wafer-level fabricated carbon nanotube-field-effect transistors. Nanotechnology. 2016 Oct 28;27(43):435203. doi: 10.1088/0957-4484/27/43/435203. Epub 2016 Sep 23. PMID: 27659173.
Copy
Download .nbib