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Mánuel JM, Koch CT, Özdöl VB, et al. Inline electron holography and VEELS for the measurement of strain in ternary and quaternary (In,Al,Ga)N alloyed thin films and its effect on bandgap energy. J Microsc. 2015;261(1):27-35doi: 10.1111/jmi.12312.
Mánuel, J. M., Koch, C. T., Özdöl, V. B., Sigle, W., VAN Aken, P. A., García, R., & Morales, F. M. (2015). Inline electron holography and VEELS for the measurement of strain in ternary and quaternary (In,Al,Ga)N alloyed thin films and its effect on bandgap energy. Journal of microscopy, 261(1), 27-35. https://doi.org/10.1111/jmi.12312
Mánuel, J M, et al. "Inline electron holography and VEELS for the measurement of strain in ternary and quaternary (In,Al,Ga)N alloyed thin films and its effect on bandgap energy." Journal of microscopy vol. 261,1 (2015): 27-35. doi: https://doi.org/10.1111/jmi.12312
Mánuel JM, Koch CT, Özdöl VB, Sigle W, VAN Aken PA, García R, Morales FM. Inline electron holography and VEELS for the measurement of strain in ternary and quaternary (In,Al,Ga)N alloyed thin films and its effect on bandgap energy. J Microsc. 2015 Jan;261(1):27-35. doi: 10.1111/jmi.12312. Epub 2015 Sep 15. PMID: 26372901.
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