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Liu SW, Lee CC, Su WC, et al. Downscaling the Sample Thickness to Sub-Micrometers by Employing Organic Photovoltaic Materials as a Charge-Generation Layer in the Time-of-Flight Measurement. Sci Rep. 2015;5:10384doi: 10.1038/srep10384.
Liu, S. W., Lee, C. C., Su, W. C., Yuan, C. H., Lin, C. F., Chen, K. T., Shu, Y. S., Li, Y. Z., Su, T. H., Huang, B. Y., Chang, W. C., & Liu, Y. H. (2015). Downscaling the Sample Thickness to Sub-Micrometers by Employing Organic Photovoltaic Materials as a Charge-Generation Layer in the Time-of-Flight Measurement. Scientific reports, 510384. https://doi.org/10.1038/srep10384
Liu, Shun-Wei, et al. "Downscaling the Sample Thickness to Sub-Micrometers by Employing Organic Photovoltaic Materials as a Charge-Generation Layer in the Time-of-Flight Measurement." Scientific reports vol. 5 (2015): 10384. doi: https://doi.org/10.1038/srep10384
Liu SW, Lee CC, Su WC, Yuan CH, Lin CF, Chen KT, Shu YS, Li YZ, Su TH, Huang BY, Chang WC, Liu YH. Downscaling the Sample Thickness to Sub-Micrometers by Employing Organic Photovoltaic Materials as a Charge-Generation Layer in the Time-of-Flight Measurement. Sci Rep. 2015 May 22;5:10384. doi: 10.1038/srep10384. PMID: 25999238; PMCID: PMC4441200.
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