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Barnard ES, Hoke ET, Connor ST, et al. Probing carrier lifetimes in photovoltaic materials using subsurface two-photon microscopy. Sci Rep. 2013;3:2098doi: 10.1038/srep02098.
Barnard, E. S., Hoke, E. T., Connor, S. T., Groves, J. R., Kuykendall, T., Yan, Z., Samulon, E. C., Bourret-Courchesne, E. D., Aloni, S., Schuck, P. J., Peters, C. H., & Hardin, B. E. (2013). Probing carrier lifetimes in photovoltaic materials using subsurface two-photon microscopy. Scientific reports, 32098. https://doi.org/10.1038/srep02098
Barnard, Edward S, et al. "Probing carrier lifetimes in photovoltaic materials using subsurface two-photon microscopy." Scientific reports vol. 3 (2013): 2098. doi: https://doi.org/10.1038/srep02098
Barnard ES, Hoke ET, Connor ST, Groves JR, Kuykendall T, Yan Z, Samulon EC, Bourret-Courchesne ED, Aloni S, Schuck PJ, Peters CH, Hardin BE. Probing carrier lifetimes in photovoltaic materials using subsurface two-photon microscopy. Sci Rep. 2013;3:2098. doi: 10.1038/srep02098. PMID: 23807197; PMCID: PMC3695573.
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