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Xu JP, Zhang RJ, Zhang Y, et al. The thickness-dependent band gap and defect features of ultrathin ZrO2 films studied by spectroscopic ellipsometry. Phys Chem Chem Phys. 2016;18(4):3316-21doi: 10.1039/c5cp05592j.
Xu, J. P., Zhang, R. J., Zhang, Y., Wang, Z. Y., Chen, L., Huang, Q. H., Lu, H. L., Wang, S. Y., Zheng, Y. X., & Chen, L. Y. (2016). The thickness-dependent band gap and defect features of ultrathin ZrO2 films studied by spectroscopic ellipsometry. Physical chemistry chemical physics : PCCP, 18(4), 3316-21. https://doi.org/10.1039/c5cp05592j
Xu, Ji-Ping, et al. "The thickness-dependent band gap and defect features of ultrathin ZrO2 films studied by spectroscopic ellipsometry." Physical chemistry chemical physics : PCCP vol. 18,4 (2016): 3316-21. doi: https://doi.org/10.1039/c5cp05592j
Xu JP, Zhang RJ, Zhang Y, Wang ZY, Chen L, Huang QH, Lu HL, Wang SY, Zheng YX, Chen LY. The thickness-dependent band gap and defect features of ultrathin ZrO2 films studied by spectroscopic ellipsometry. Phys Chem Chem Phys. 2016 Jan 28;18(4):3316-21. doi: 10.1039/c5cp05592j. PMID: 26752103.
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