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Kurniawan KH, Pardede M, Hedwig R, et al. Practical and highly sensitive elemental analysis for aqueous samples containing metal impurities employing electrodeposition on indium-tin oxide film samples and laser-induced shock wave plasma in low-pressure helium gas. Appl Opt. 2015;54(25):7592-7doi: 10.1364/AO.54.007592.
Kurniawan, K. H., Pardede, M., Hedwig, R., Abdulmadjid, S. N., Lahna, K., Idris, N., Jobiliong, E., Suyanto, H., Suliyanti, M. M., Tjia, M. O., Lie, T. J., Lie, Z. S., Kurniawan, D. P., & Kagawa, K. (2015). Practical and highly sensitive elemental analysis for aqueous samples containing metal impurities employing electrodeposition on indium-tin oxide film samples and laser-induced shock wave plasma in low-pressure helium gas. Applied optics, 54(25), 7592-7. https://doi.org/10.1364/AO.54.007592
Kurniawan, Koo Hendrik, et al. "Practical and highly sensitive elemental analysis for aqueous samples containing metal impurities employing electrodeposition on indium-tin oxide film samples and laser-induced shock wave plasma in low-pressure helium gas." Applied optics vol. 54,25 (2015): 7592-7. doi: https://doi.org/10.1364/AO.54.007592
Kurniawan KH, Pardede M, Hedwig R, Abdulmadjid SN, Lahna K, Idris N, Jobiliong E, Suyanto H, Suliyanti MM, Tjia MO, Lie TJ, Lie ZS, Kurniawan DP, Kagawa K. Practical and highly sensitive elemental analysis for aqueous samples containing metal impurities employing electrodeposition on indium-tin oxide film samples and laser-induced shock wave plasma in low-pressure helium gas. Appl Opt. 2015 Sep 01;54(25):7592-7. doi: 10.1364/AO.54.007592. PMID: 26368882.
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