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Pelzer G, Zang A, Anton G, et al. Energy weighted x-ray dark-field imaging. Opt Express. 2014;22(20):24507-15doi: 10.1364/OE.22.024507.
Pelzer, G., Zang, A., Anton, G., Bayer, F., Horn, F., Kraus, M., Rieger, J., Ritter, A., Wandner, J., Weber, T., Fauler, A., Fiederle, M., Wong, W. S., Campbell, M., Meiser, J., Meyer, P., Mohr, J., & Michel, T. (2014). Energy weighted x-ray dark-field imaging. Optics express, 22(20), 24507-15. https://doi.org/10.1364/OE.22.024507
Pelzer, Georg, et al. "Energy weighted x-ray dark-field imaging." Optics express vol. 22,20 (2014): 24507-15. doi: https://doi.org/10.1364/OE.22.024507
Pelzer G, Zang A, Anton G, Bayer F, Horn F, Kraus M, Rieger J, Ritter A, Wandner J, Weber T, Fauler A, Fiederle M, Wong WS, Campbell M, Meiser J, Meyer P, Mohr J, Michel T. Energy weighted x-ray dark-field imaging. Opt Express. 2014 Oct 06;22(20):24507-15. doi: 10.1364/OE.22.024507. PMID: 25322026.
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